B. Vincent Crist

Handbook of Monochromatic XPS Spectra, 3 Volume Set

• Gebundenes Buch

Produktbeschreibung

Das "Handbook of Monochromatic XPS Spectra" besteht aus den drei Bänden, The Elements and Native Oxides, Semiconductors und Polymers and Polymer Damage, die hier als Set preisgünstiger angeboten werden. Diese drei Bände sind eine in sich abgeschlossene Sammlung monochromatischer XPS-Spektren in der Hand - eine unentbehrliche Hilfe im Laboralltag vieler Analytiker! Einleitende Kapitel erläutern die verwendete instrumentelle Ausrüstung, die Proben und die Verfahren der Spektrenaufnahme. Im Spektrenteil sind alle Peaks beschriftet, die Spektren sind durch umfangreiches Datenmaterial (Atom-%-Tabellen, Bindungsenergien, Halbwertsbreite usw.) ergänzt. Ein Muß für jedes XPS-Labor! (11/00)

Produktdetails

• Verlag: Wiley & Sons
• 1. Auflage
• Seitenzahl: 1570
• Erscheinungstermin: 19. Oktober 2000
• Englisch
• Abmessung: 221mm x 267mm x 99mm
• Gewicht: 4160g
• ISBN-13: 9780471498100
• ISBN-10: 0471498106
• Artikelnr.: 25143513

Autorenporträt

B. Vincent Crist is the author of Handbook of Monochromatic XPS Spectra, 3 Volume Set, published by Wiley.

Inhaltsangabe

Table Of Contents Each volume contains a 20 page introductory section
giving: Instrument Details; Experimental Details; Data Processing Details;
Sample Details (source of the samples. benefits and drawbacks of powdered
samples being pressed into pellets); Energy Resolution Details; Energy
Scale Reference Energies and Calibration Details; Electron Counting and
Instrument Response Function Details; Effects of Poorly Focusing the
Distance between the Sample and Electron Collection Lense; Quantitation
Details and Choice of Sensitivity Exponent; Crude Tests of the Reliability
of Relative Sensitivity Factors; Traceability Details; Traceability of
Reference Binding Energies; Traceability Transfer from Pure Metals to
Non-conductive Binary Oxides; Traceability of Relative Sensitivity Factors
for Quantitation; Traceablity of Sample Purity; Reference Papers Describing
the Capabilities of X-probe, M-probe and S-probe XPS systems. Includes wide
scan and high energy resolution spectra for 76 elements and the native
oxides of 39 elements Among the many valuable features included in each of
these handbooks are: * All Spectra are measured using AlK monochromatic
X-rays * All spectra are collected in a self consistent manner to maximise
data reliability and quality * All peaks in the wide spectra are fully
annotated and accompanied by detailed atom % tables that report Bes for
each of the labelled peaks Each high-energy resolution spectra is
peak-fitted with detailed tables containing binding energies, FWHMs and
relative percentages.

Rezensionen

"...an invaluable collection..."
--Materials World, December 2000