Lev. I. Mirkin

Handbook of X-Ray Analysis of Polycrystalline Materials

• Broschiertes Buch

Produktbeschreibung

The book is best used in the following sequence. (1) The radiation and method of recording are selected in accordance with the data of Chapters 1 and 2; the detailed param eters for the recording are defined. (2) The patterns are indexed with the assistance of the graphs and tables of Chapter 3. (3) The measured intensities are compared with the values found from the tables of Chapter 4. (4) The particular problem at hand (determi nation of stresses, phase analysis, and so on) is solved with the aid of the tables and nomo grams given in the second part of the book. The nomograms can be enlarged for use if necessary. This is not the only mode of use; in particular, the material in the appropriate chapter may be sufficient for a particular type of routine analysis. I have had the benefit of valuable advice from workers in various laboratories (Moscow State University, Moscow Steel Institute, the Institute of Crystallography, the Central Research Institute for Ferrous Metallurgy, the Technological Research Institute of the Automobile Industry, the Karpov Institute of Physical Chemistry, the All-Union Hard Alloys K~search Institute, and so on). In addition, I am deeply indebted for much assistance to Professor Ya. S. Umanskii (scientific editor), Professor V. I. Iveronova, Professor A. I. Kitaigorodskii, G. A. Gol'der, and V. I. Rydnik. I recognize that this work cannot be free from deficiencies, and I should like to thank in advance workers in x-ray laboratories who may offer criticisms.

Produktdetails

• Verlag: Springer / Springer US / Springer, Berlin
• Artikelnr. des Verlages: 978-1-4684-6062-9
• Softcover reprint of the original 1st ed. 1964
• Seitenzahl: 756
• Erscheinungstermin: 18. März 2012
• Englisch
• Abmessung: 254mm x 178mm x 41mm
• Gewicht: 1395g
• ISBN-13: 9781468460629
• ISBN-10: 1468460625
• Artikelnr.: 39492531

Inhaltsangabe

1: General Methods of X-Ray Structure Analysis.- 1. Interaction of X-Rays with Matter. X-Ray Spectra.- 2. Production and Measurement of X-Ray Patterns.- 3. Indexing of X-Ray Patterns.- 4. Line Intensities on X-Ray Patterns.- 2: Some Special Problems and Methods in X-Ray Structure Analysis.- 5. Phase Analysis.- 6. Precision Measurement of Lattice Constants.- 7. Determination of Macroscopic Stresses.- 8. Determination of Crystallite and Block Sizes, of Microstresses, and of Lattice Distortion.- 9. Determination of Preferred Orientations (Textures).- 10. Diffuse Scattering of X-Rays and Small-Angle Scattering.- 11. Electron Diffraction.- 12. Neutron Diffraction.- Literature Cited.