Taehyoun Oh, Ramesh Harjani

High Performance Multi-Channel High-Speed I/O Circuits

• Gebundenes Buch

Produktbeschreibung

This book describes design techniques that can be used to mitigate crosstalk in high-speed I/O circuits. It examines the problem of crosstalk and ISI mitigation encountered as data rates have continued beyond 10Gb/s.

Produktdetails

• Analog Circuits and Signal Processing
• Verlag: Springer / Springer New York / Springer, Berlin
• Artikelnr. des Verlages: 86130364, 978-1-4614-4962-1
• 2014
• Seitenzahl: 100
• Erscheinungstermin: 7. September 2013
• Englisch
• Abmessung: 241mm x 160mm x 11mm
• Gewicht: 268g
• ISBN-13: 9781461449621
• ISBN-10: 1461449626
• Artikelnr.: 36028156

Inhaltsangabe

Introduction.- 2x6 Gb/s MIMO Crosstalk Cancellation and Signal Reutilization Scheme in 130 nm CMOS Process.- 4x12 Gb/s MIMO Crosstalk Cancellation and Signal Reutilization Receiver in 65 nm CMOS Process.- Adaptive XTCR, AGC, and Adaptive DFE Loop.- Research Summary & Contributions.- References.- Appendix A: Noise Analysis.- Appendix B: Issues of Applying Consecutive 2x2 XTCR on Multi-Lane I/Os ( 4).- Appendix C: Transmitter-Side Discrete-Time FIR XTC Filter versus Receiver-Side Analog-IIR XTC Filter.- Appendix D: Line Mismatch Sensitivity.- Appendix E: Input Matching for 4x4 XTCR Receiver Test Bench.- Appendix F: Bandwidth Improvement by Technology Scaling.

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Introduction.- 2x6 Gb/s MIMO Crosstalk Cancellation and Signal Reutilization Scheme in 130 nm CMOS Process.- 4x12 Gb/s MIMO Crosstalk Cancellation and Signal Reutilization Receiver in 65 nm CMOS Process.- Adaptive XTCR, AGC, and Adaptive DFE Loop.- Research Summary & Contributions.- References.- Appendix A: Noise Analysis.- Appendix B: Issues of Applying Consecutive 2x2 XTCR on Multi-Lane I/Os (≥ 4).- Appendix C: Transmitter-Side Discrete-Time FIR XTC Filter versus Receiver-Side Analog-IIR XTC Filter.- Appendix D: Line Mismatch Sensitivity.- Appendix E: Input Matching for 4x4 XTCR Receiver Test Bench.- Appendix F: Bandwidth Improvement by Technology Scaling.