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High-Pressure Rheology for Quantitative Elastohydrodynamics, Second Edition, contains updated sections on scaling laws and thermal effects, including new sections on the importance of the pressure dependence of viscosity, the role of the localization limit of stress, and new material on the shear dependence of viscosity and temperature dependence viscosity. Since publication of the original edition, the experimental methods, the resulting property data and new correlations have resulted in a revolution in understanding of the mechanisms of film formation and the mechanical dissipation.

Produktbeschreibung
High-Pressure Rheology for Quantitative Elastohydrodynamics, Second Edition, contains updated sections on scaling laws and thermal effects, including new sections on the importance of the pressure dependence of viscosity, the role of the localization limit of stress, and new material on the shear dependence of viscosity and temperature dependence viscosity. Since publication of the original edition, the experimental methods, the resulting property data and new correlations have resulted in a revolution in understanding of the mechanisms of film formation and the mechanical dissipation.
Autorenporträt
Scott Bair received his Ph.D. in mechanical engineering and is currently a Principal Research Engineer and Director at the Center for High-Pressure Rheology at the Georgia Institute of Technology, USA. In 2009, he was the recipient of the International Award for the highest honor given by the Society of Tribologists and Lubrication Engineers. His main research areas are tribology, rheology, properties of liquids at high pressure, and machine design.