John C H Spence

High-Resolution Electron Microscopy

• Broschiertes Buch

Produktbeschreibung

This book describes how to see atoms using electron microscopes. This new edition includes updated sections on applications and new uses of atomic-resolution transmission electron microscopy. Several new chapters and sources of software for image interpretation and electron-optical design have also been added.

Produktdetails

• Verlag: Oxford University Press, USA
• 3rd Revised edition
• Seitenzahl: 424
• Erscheinungstermin: 15. Februar 2009
• Englisch
• Abmessung: 231mm x 157mm x 23mm
• Gewicht: 617g
• ISBN-13: 9780199552757
• ISBN-10: 0199552754
• Artikelnr.: 26006359

Autorenporträt

John Spence is a Fellow of the American Physical Society and of the Institute of physics, a recent co-editor of Acta Crystallographica and serves on the editorial board of Reports on Progress in Physics. He also serves on the Scientific Advisory Committee of the Molecular Foundary and the Advanced Light Source at the Lawrence Berkeley Laboratory. He is a member of the International Union of Crystallography's Commission on Electron Diffraction, and winner of the Burton award of the Microscopy Society of America.

Inhaltsangabe

1: Preliminaries
2: Electron Optics
3: Wave Optics
4: Coherence and Fourier Optics
5: Imaging Thin Crystals and their Defects
6: Imaging Molecules: Radiation Damage
7: Image Processing, Super-Resolution, Diffractive Imaging
8: STEM and Z-contrast
9: Electron Sources and Detectors
10: Measurement of Electron-Optical Parameters
11: Instabilities and the Microscope Environment
12: Experimental Methods
13: Associated Techniques and Software Resources
Appendices