Pradeep Kumar Yadav, Sushma Tiwari

Inheritance study of agronomical traits and characterization

for bread wheat (Tritium aestivum L.)

• Broschiertes Buch

Produktbeschreibung

Wheat (Triticum aestivum L.) is the world's most staple food crop as well as most consumed cereal. Several biotic and abiotic factors cause yield loss of wheat production. Among several pathogens damaging wheat crop, rust pathogens are the most prevalent. They are reported from all wheat growing countries and causes a severe damage to the wheat production worldwide. There are three types of rust majorly affect wheat production in India: leaf rust caused by Puccinia recondita, stem rust by Puccinia graminis triticii and stripe rust by Puccinia striformis. Identification of rust resistant genotypes and further utilization of these genotypes in wheat breeding programme is one of the prive objective in wheat improvement programme. An experiment was conducted consisted of 41 diverse genotypes of wheat (Triticum aestivum L.), 10 NGSN lines (National Genetic Stock Nursary), 14 F1 were selected for the study and F2 population of HS599 X Sonalika, HS599 X Raj 4480, HS 599 X GW 2013-491 were selected for the study during rabi 2018-19 and 2019-20.

Produktdetails

• Verlag: LAP Lambert Academic Publishing
• Seitenzahl: 152
• Erscheinungstermin: 24. Juni 2023
• Englisch
• Abmessung: 220mm x 150mm x 10mm
• Gewicht: 244g
• ISBN-13: 9786206183846
• ISBN-10: 620618384X
• Artikelnr.: 68442970

Autorenporträt

P. K. Yadav, born in 1996, hails from the reputed agricultural family of Madhya Pradesh (district - Gwalior). He graduated in agriculture from College of Agriculture, Indore, and obtained his Master's degree from College of Agriculture, Gwalior, and currently is pursuing a Doctorate degree from RVSKVV, Gwalior. He has 5 publications to his credit.