Integrated Circuit Design for Radiation Environments
169,99 €
inkl. gesetzl. MwSt.,
Beschreibung
Produktdetails
Einband
Gebundene Ausgabe
Erscheinungsdatum
31.12.2019
Verlag
WileySeitenzahl
400
Maße (L/B/H)
24,6/16,8/2,5 cm
Gewicht
880 g
Sprache
Englisch
ISBN
978-1-119-96634-0
A PRACTICAL GUIDE TO THE EFFECTS OF RADIATION ON SEMICONDUCTOR COMPONENTS OF ELECTRONIC SYSTEMS, AND TECHNIQUES FOR THE DESIGNING, LAYING OUT, AND TESTING OF HARDENED INTEGRATED CIRCUITS
This book teaches the fundamentals of radiation environments and their effects on electronic components, as well as how to design, lay out, and test cost-effective hardened semiconductor chips not only for today's space systems but for commercial terrestrial applications as well. It provides a historical perspective, the fundamental science of radiation, and the basics of semiconductors, as well as radiation-induced failure mechanisms in semiconductor chips.
Integrated Circuit Design for Radiation Environments starts by introducing readers to semiconductors and radiation environments (including space, atmospheric, and terrestrial environments) followed by circuit design and layout. The book introduces radiation effects phenomena (including single-event effects, total ionizing dose damage and displacement damage) and shows how technological solutions can address both phenomena.
- Describes the fundamentals of radiation environments and their effects on electronic components
- Teaches readers how to design, lay out and test cost-effective hardened semiconductor chips for space systems and commercial terrestrial applications
- Covers natural and man-made radiation environments, space systems and commercial terrestrial applications
- Provides up-to-date coverage of state-of-the-art radiation hardening technology in one concise volume
- Includes problems at the end of each chapter for the reader to test their knowledge
Integrated Circuit Design for Radiation Environments will appeal to researchers and product developers in the semiconductor, space, and defense industries, as well as electronic engineers in the medical field. The book is also helpful for system, layout, process, device, reliability, applications, ESD, latchup and circuit design semiconductor engineers, along with anyone involved in micro-electronics used in harsh environments.
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