Interferometrie mit Röntgen- und Neutronenstrahlen. Flüssige Kristalle: Strukturen, Eigenschaften und Bedeutung
250. Sitzung am 2. März 1977 in Düsseldorf
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Using Bragg-diffraction from perfect single crystals it becomes possible to split coherently, deviate about large angles and finally superimpose X-rays and thermal neutron beams in the same manner as has been possible for a long time with visible light. Interferometry with angstrom range radiation furnishes information about phases and amplitudes of scattered waves, the structure of defects in nearly perfect crystals, and in the neutron case - about nuclear and magnetic scattering processes. Interferometric precision has thus become available on the very atomic scale. Literatur 1 U. Bonse, M. ...
Using Bragg-diffraction from perfect single crystals it becomes possible to split coherently, deviate about large angles and finally superimpose X-rays and thermal neutron beams in the same manner as has been possible for a long time with visible light. Interferometry with angstrom range radiation furnishes information about phases and amplitudes of scattered waves, the structure of defects in nearly perfect crystals, and in the neutron case - about nuclear and magnetic scattering processes. Interferometric precision has thus become available on the very atomic scale. Literatur 1 U. Bonse, M. Hart: Appl. Phys. Lett. 6, 155 (1965). 2 H. Rauch, W. Treimer, U. Bonse: Phys. Lett. 47 A, 369 (1974). 3 W. Bauspiess, U. Bonse, H. Rauch, W. Treimer: Z. Physik 271, 177 (1974). , U. Bonse: Present State of X-ray Interferometry; in Proceedings of the 5th Int. Congr. on X-Ray Optics and Microanalysis, ed. by G. Mollenstedt und K. H. Gaukler (Springer: Berlin, Heidelberg, New York 1969) 1-10. 5 M. Hart: Rep. on Prog. Phys. 34,435 (1971). 6 M. Hart: Proc. R. Soc. A 346, 1 (1975). 7 U. Bonse, W. Graeff: X-Ray and Neutron Interferometry; in X-Ray Optics, ed. by H.J. Queisser (Springer: Berlin, Heidelberg, New York 1977) 93-143. 8 M. Ando, S. Hosoya: "An Attempt at X-Ray Phase Contrast Microscopy" in Proceedings of the Sixth Int. Conf. on X-Ray Optics and Microanalysis, ed. by G. Shinoda, K. Kohra and T. Ichinokawa (University of Tokyo Press 1972), pp.63-68.
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