Alodeep Sanyal, Sandip Kundu, Ilia Polian

Intermittent Failures in Integrated Circuits: Detection, Characterization and Fault Tolerance

• Gebundenes Buch

Produktbeschreibung

This book presents a consolidated study of the entire class of intermittent failures by analyzing the root causes behind these errors, their efficient detection and characterization, and finally fault tolerant design techniques at various layers of abstraction (from transistor to architecture) to improve reliability of system operation in presence of intermittent errors.

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Produktdetails

• Verlag: Springer, Berlin
• Artikelnr. des Verlages: 978-1-4419-8314-5
• 1st ed.
• Seitenzahl: 300
• Erscheinungstermin: 6. Januar 2016
• Englisch
• ISBN-13: 9781441983145
• ISBN-10: 1441983147
• Artikelnr.: 32299598

Autorenporträt

Dr. Sandip Kundu is a professor in the Electrical and Computer Engineering Department at the University of Massachusetts at Amherst, specializing in semiconductor and lithographic manufacturing.

Inhaltsangabe

Introduction.- Fundamentals of VLSI Testing.- Circuit Marginality and Noise Sources.- Fault Modeling for Intermittent Errors.- Automatic Test Pattern Generation.- Design-for-Testability.- Test Economics and Cost-Benefit Analysis.- Layout Level Fault Tolerance.- Circuit Level Fault Tolerance.- Gate Level Fault Tolerance.- System Level Fault Tolerance.- Information Level Fault Tolerance.