138,99 €
inkl. MwSt.
Versandkostenfrei*
Versandfertig in über 4 Wochen
  • Gebundenes Buch

This book presents a consolidated study of the entire class of intermittent failures by analyzing the root causes behind these errors, their efficient detection and characterization, and finally fault tolerant design techniques at various layers of abstraction (from transistor to architecture) to improve reliability of system operation in presence of intermittent errors.

Produktbeschreibung
This book presents a consolidated study of the entire class of intermittent failures by analyzing the root causes behind these errors, their efficient detection and characterization, and finally fault tolerant design techniques at various layers of abstraction (from transistor to architecture) to improve reliability of system operation in presence of intermittent errors.
Autorenporträt
Dr. Sandip Kundu is a professor in the Electrical and Computer Engineering Department at the University of Massachusetts at Amherst, specializing in semiconductor and lithographic manufacturing.