C Julian Chen

Introduction to Scanning Tunneling Microscopy

• Broschiertes Buch

Produktbeschreibung

The scanning tunneling and the atomic force microscope, both capable of imaging individual atoms, were crowned with the Physics Nobel Prize in 1986, and are the cornerstones of nanotechnology today. The 1st edition has nurtured numerous beginners and experts since 1993. The 2nd edition is a thoroughly updated version of this 'bible' in the field.

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Produktdetails

• Verlag: Oxford University Press, USA
• 2nd edition
• Seitenzahl: 488
• Erscheinungstermin: 15. Februar 2016
• Englisch
• Abmessung: 229mm x 152mm x 28mm
• Gewicht: 726g
• ISBN-13: 9780198754756
• ISBN-10: 0198754752
• Artikelnr.: 47867577

Autorenporträt

C. Julian Chen, Department of Applied Physics and Applied Mathematics, Columbia University, New York, USA.

Inhaltsangabe

1: Overview
Part I
PRINCIPLES
2: Tunneling Phenomena
3: Tunneling Matrix Elements
4: Atomic forces
5: Atomic Forces and Tunneling
6: Nanometer-Scale Imaging
7: Atomic-Scale Imaging
8: Nanomechanical Effects
Part II
INSTRUMENTATION
9: Piezoelectric Scanners
10: Vibration Isolation
11: Electronics and Control
12: Mechanical Design
13: Tip Treatment
14: Scanning Tunneling Spectroscopy
15: The Atomic Force Microscope
16: Illustrative Applications
APPENDICES
A: Green's Functions
B: Spherical Modified Bessel Functions
C: Surface symmetry
D: Elementary elasticity theory