This textbook focuses on developing practical skills in employing sophisticated design tools and proficiency in advanced VLSI design, covering the various stages of design implementation, verification, and testing. It will be a vital resource for students aspiring to join the semiconductor industry as well as a refresher for professionals.
This textbook focuses on developing practical skills in employing sophisticated design tools and proficiency in advanced VLSI design, covering the various stages of design implementation, verification, and testing. It will be a vital resource for students aspiring to join the semiconductor industry as well as a refresher for professionals.Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
Sneh Saurabh is Associate Professor at the Department of Electronics and Communication Engineering at the Indraprastha Institute of Information Technology, New Delhi, India. He has rich experience in the semiconductor industry, having spent sixteen years working for industry leaders such as Cadence Design Systems, Synopsys India, and Magma Design Automation. His research interests include VLSI design and automation, nanoelectronics, and energy-efficient systems.
Inhaltsangabe
Part I. Overview of VLSI Design Flow: Chapter 1. Foundation Chapter 2. Introduction to Integrated Circuits Chapter 3. Pre-RTL Methodologies Chapter 4. RTL to GDS Implementation Flow Chapter 5. Verification Techniques Chapter 6. Testing Techniques Chapter 7. Post-GDS Processes Part II. Logic Design: Chapter 8. Modeling Hardware using Verilog Chapter 9. Simulation-based Verification Chapter 10. RTL Synthesis Chapter 11. Formal Verification, Chapter 12. Logic Optimization Chapter 13. Technology Library Chapter 14. Static Timing Analysis Chapter 15. Constraints Chapter 16. Technology Mapping Chapter 17. Timing-driven Optimizations Chapter 18. Power Analysis Chapter 19. Power-driven Optimizations Part III. Design for Testability (DFT): Chapter 20. Basics of DFT Chapter 21. Scan Design Chapter 22. Automatic Test Pattern Generation (ATPG) Chapter 23. Built-in Self-test (BIST) Part IV. Physical Design: Chapter 24. Basic Concepts for Physical Design Chapter 25. Chip Planning Chapter 26. Placement Chapter 27. Clock Tree Synthesis (CTS) Chapter 28. Routing Chapter 29. Physical Verification and Signoff Chapter 30. Post-silicon Validation.