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As the device scales down, several serious design challenges emerges namely design complexity, power, crosstalk, delay and reliability. The design challenges are interrelated and a tradeoff has to be done for yielding a reliable structure for portable microelectronic devices in the DSM era.. By considering this, the book focuses on developing a reliability prediction system using failure mechanism analysis.The work suggests the ways to handle failure mechanisms to maintain the reliability of power semiconductor device. Hence, the need for a lifetime aware device design has been emphasized in this book.…mehr

Produktbeschreibung
As the device scales down, several serious design challenges emerges namely design complexity, power, crosstalk, delay and reliability. The design challenges are interrelated and a tradeoff has to be done for yielding a reliable structure for portable microelectronic devices in the DSM era.. By considering this, the book focuses on developing a reliability prediction system using failure mechanism analysis.The work suggests the ways to handle failure mechanisms to maintain the reliability of power semiconductor device. Hence, the need for a lifetime aware device design has been emphasized in this book.
Autorenporträt
Senthilrani concluiu o doutoramento na área de Engenharia de Informação e Comunicação na Universidade Anna Chennai em 2017. Iniciou a sua profissão como professora na Faculdade de Engenharia e Tecnologia do PSNA, Dindigul no ano de 2005. Em 2008, ingressou como professora na Faculdade de EEE no Velammal College of Engineering and Technology, Madurai.