Lifetime aware device design using failure mechanism analysis - Shanmugavelu, Senthilrani
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As the device scales down, several serious design challenges emerges namely design complexity, power, crosstalk, delay and reliability. The design challenges are interrelated and a tradeoff has to be done for yielding a reliable structure for portable microelectronic devices in the DSM era.. By considering this, the book focuses on developing a reliability prediction system using failure mechanism analysis.The work suggests the ways to handle failure mechanisms to maintain the reliability of power semiconductor device. Hence, the need for a lifetime aware device design has been emphasized in this book.…mehr

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Produktbeschreibung
As the device scales down, several serious design challenges emerges namely design complexity, power, crosstalk, delay and reliability. The design challenges are interrelated and a tradeoff has to be done for yielding a reliable structure for portable microelectronic devices in the DSM era.. By considering this, the book focuses on developing a reliability prediction system using failure mechanism analysis.The work suggests the ways to handle failure mechanisms to maintain the reliability of power semiconductor device. Hence, the need for a lifetime aware device design has been emphasized in this book.
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Autorenporträt
Senthilrani concluiu o doutoramento na área de Engenharia de Informação e Comunicação na Universidade Anna Chennai em 2017. Iniciou a sua profissão como professora na Faculdade de Engenharia e Tecnologia do PSNA, Dindigul no ano de 2005. Em 2008, ingressou como professora na Faculdade de EEE no Velammal College of Engineering and Technology, Madurai.