Logic Testing and Design for Testability - Fujiwara, Hideo
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Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing.

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Produktbeschreibung
Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing.
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Autorenporträt
Hideo Fujiwara is an associate professor in the Department of Electronics and Communication, Meiji University.