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This work aims to exploit the potential of nano scale memories like MTJ based Magnetoresistive RAM for use in cell phone architectures by replacing age old flash memories through a series of simulations performed using various tools. Magnetoresistive memory (MRAM) is one of the forerunners of the nanotechnology enabled memories lined to replace the traditional memories like Flash, DRAM and SRAM. MRAMs are based on the phenomenon of spin dependent tunneling in magnetic tunnel junctions (MTJs). It stores data in the magnetization of a magnetic layer as opposed to electrical charge in…mehr

Produktbeschreibung
This work aims to exploit the potential of nano scale memories like MTJ based Magnetoresistive RAM for use in cell phone architectures by replacing age old flash memories through a series of simulations performed using various tools. Magnetoresistive memory (MRAM) is one of the forerunners of the nanotechnology enabled memories lined to replace the traditional memories like Flash, DRAM and SRAM. MRAMs are based on the phenomenon of spin dependent tunneling in magnetic tunnel junctions (MTJs). It stores data in the magnetization of a magnetic layer as opposed to electrical charge in conventional RAMs. Yet the read-out of the MRAM is electrical. It is claimed to offer something close to the speed of SRAM, with a density approaching that of single-transistor DRAM and the ability to store information when power is removed, like flash memory or EEPROM.
Autorenporträt
Mr. Mayank Chakraverty has completed his Bachelors Degree and Masters Degree in Electronics Engineering from India. His areas of interest includes Semiconductor Devices, Memories, Process Technology, MEMS, Digital Design, Nanoelectronics and VLSI System Design. He has published several papers in International Journals & IEEE Conferences of repute.