Materials, Processes and Reliability for Advanced Interconnects for Micro - and Nonelectronics 2009

Herausgeber: Gall, Martin

• Gebundenes Buch

Produktbeschreibung

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Produktdetails

• Verlag: Cambridge University Press
• Seitenzahl: 204
• Erscheinungstermin: 18. November 2009
• Englisch
• Abmessung: 235mm x 157mm x 16mm
• Gewicht: 456g
• ISBN-13: 9781605111292
• ISBN-10: 1605111295
• Artikelnr.: 35461419

Inhaltsangabe

Part I. Low-k Dielectrics I
Part II. Low-k Dielectrics II
Part III. Poster Session: Interconnects
Part IV. Metalization I
Part V. Metallization II
Part VI. Reliability
Part VII. Emerging Interconnect Technologies
Part VIII. Joint Session: Interconnect and Packaging
Author index
Subject index.