Measuring Success

Testing, Grades, and the Future of College Admissions
Herausgeber: Buckley, Jack; Wildavsky, Ben; Letukas, Lynn

• Gebundenes Buch

Produktbeschreibung

Shaw, Kyle Sweitzer, Roger J. Thompson, Meredith Welch, Rebecca Zwick

Produktdetails

• Verlag: Johns Hopkins University Press
• Seitenzahl: 344
• Erscheinungstermin: 15. Januar 2018
• Englisch
• Abmessung: 226mm x 152mm x 30mm
• Gewicht: 600g
• ISBN-13: 9781421424965
• ISBN-10: 1421424967
• Artikelnr.: 49670413

Autorenporträt

Jack Buckley is the senior vice president of research and evaluation at the American Institutes for Research and a research associate professor of applied statistics at New York University. He is the coauthor of Charter Schools: Hope or Hype?Lynn Letukas is an associate research scientist at the College Board. She is the author of Primetime Pundits: How Cable News Covers Social Issues. BenWildavsky is senior fellow and executive director at the College Board Policy Center. He is the author of The Great Brain Race: How Global Universities are Reshaping the World.