Memory Architecture Exploration for Programmable Embedded Systems - Grun, Peter;Dutt, Nikil D.;Nicolau, Alexandru
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Memory Architecture Exploration for Programmable Embedded Systems addresses efficient exploration of alternative memory architectures, assisted by a "compiler-in-the-loop" that allows effective matching of the target application to the processor-memory architecture. This new approach for memory architecture exploration replaces the traditional black-box view of the memory system and allows for aggressive co-optimization of the programmable processor together with a customized memory system. The book concludes with a set of experiments demonstrating the utility of this exploration approach.…mehr

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Produktbeschreibung
Memory Architecture Exploration for Programmable Embedded Systems addresses efficient exploration of alternative memory architectures, assisted by a "compiler-in-the-loop" that allows effective matching of the target application to the processor-memory architecture. This new approach for memory architecture exploration replaces the traditional black-box view of the memory system and allows for aggressive co-optimization of the programmable processor together with a customized memory system.
The book concludes with a set of experiments demonstrating the utility of this exploration approach. The authors perform architecture and compiler exploration for a set of large, real-life benchmarks, uncovering promising memory configurations from different perspectives, such as cost, performance and power.
Rezensionen
From the reviews: "This book considers the opportunities and discusses the challenges in designing embedded memory system ... . The book is well organized, up-to-date and easy to follow for self-study. ... In general the book has high educational value. ... The book is really interesting both for specialists in the topic, and graduate students ... . The reviewer rates this book highly and recommends it to graduate students, researchers and practicing engineers in embedded systems design. Overall, the authors have done a commendable job ... ." (Mile Stojcev, Microelectronics Reliability, Vol. 47, 2004)