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Metrology and Instrumentation: Practical Applications for Engineering and Manufacturing provides students and professionals with an accessible foundation in the metrology techniques, instruments, and governing standards used in mechanical engineering and manufacturing. The book opens with an overview of metrology units and scale, then moves on to explain topics such as sources of error, calibration systems, uncertainty, and dimensional, mechanical, and thermodynamic measurement systems. A chapter on tolerance stack-ups covers GD&T, ASME Y14.5-2018, and the ISO standard for general tolerances,…mehr
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Metrology and Instrumentation: Practical Applications for Engineering and Manufacturing provides students and professionals with an accessible foundation in the metrology techniques, instruments, and governing standards used in mechanical engineering and manufacturing. The book opens with an overview of metrology units and scale, then moves on to explain topics such as sources of error, calibration systems, uncertainty, and dimensional, mechanical, and thermodynamic measurement systems. A chapter on tolerance stack-ups covers GD&T, ASME Y14.5-2018, and the ISO standard for general tolerances, while a chapter on digital measurements connects metrology to newer, Industry 4.0 applications.
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Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
Produktdetails
- Produktdetails
- Wiley-ASME Press Series
- Verlag: Wiley & Sons / Wiley-ASME Press Series
- Artikelnr. des Verlages: 1W119721730
- 1. Auflage
- Seitenzahl: 400
- Erscheinungstermin: 29. Dezember 2021
- Englisch
- Abmessung: 257mm x 183mm x 33mm
- Gewicht: 906g
- ISBN-13: 9781119721734
- ISBN-10: 1119721733
- Artikelnr.: 61938759
- Herstellerkennzeichnung
- Libri GmbH
- Europaallee 1
- 36244 Bad Hersfeld
- 06621 890
- Wiley-ASME Press Series
- Verlag: Wiley & Sons / Wiley-ASME Press Series
- Artikelnr. des Verlages: 1W119721730
- 1. Auflage
- Seitenzahl: 400
- Erscheinungstermin: 29. Dezember 2021
- Englisch
- Abmessung: 257mm x 183mm x 33mm
- Gewicht: 906g
- ISBN-13: 9781119721734
- ISBN-10: 1119721733
- Artikelnr.: 61938759
- Herstellerkennzeichnung
- Libri GmbH
- Europaallee 1
- 36244 Bad Hersfeld
- 06621 890
Samir Mekid, PhD, is Professor of Mechanical Engineering and Founding Director of the Interdisciplinary Research Center for Intelligent Manufacturing and Robotics at King Fahd University of Petroleum and Minerals in Saudi Arabia. He has worked as a design engineer with Caterpillar and is a Chartered Engineer registered with IMechE.
Preface xiii
Acknowledgments xv
About the Author xvii
1 Fundamental Units and Constants in Metrology 1
1.1 Introduction 1
1.2 Current Definitions of the Main SI Units 6
1.3 New Definition of Seven Base Units of the SI 6
1.4 Derived International System (SI) Units 7
1.5 SI Conversion 7
1.6 Fundamental Constants 8
1.7 Common Measurements 9
1.8 Principles and Practices of Traceability 10
1.8.1 Definition of Traceability 10
1.8.2 Accreditation and Conformity Assessment 11
Multiple Choice Questions of this Chapter 12
References 12
2 Scales of Metrology 13
2.1 Introduction to Practical Metrology across All Scales 13
2.2 Nanometrology 14
2.2.1 Introduction and Need in Industry 14
2.2.2 Definition of Nanometrology 15
2.2.3 Importance of Nanometrology in Science and Technology 15
2.3 Standards 18
2.4 Micrometrology 22
2.4.1 Introduction and Need in Industry 22
2.4.2 Definition of Micrometrology 22
2.4.3 Examples of Micrometrology of Microparts 22
2.5 Macroscale Metrology 23
2.5.1 Standards 25
2.6 Large-Scale Metrology and Large-Volume Metrology 29
2.6.1 Introduction and Need in Industry 29
2.6.2 Definition 30
2.6.3 Verification Standards 32
2.7 Instruments Techniques 34
2.7.1 Large Coordinate Measuring Machines 35
2.7.2 Laser Trackers 35
2.7.3 Theodolite 35
Multiple Choice Questions of this Chapter 37
References 37
3 Applied Math and Statistics 39
3.1 Introduction 39
3.2 Scientific and Engineering Notation 39
3.3 Imperial/Metric Conversions 40
3.4 Ratio 41
3.5 Linear Interpolation 42
3.6 Number Bases 42
3.7 Significant Figures, Rounding, and Truncation 43
3.8 Geometry and Volumes 44
3.8.1 Perimeter 44
3.8.2 Volume and Area 44
3.9 Angular Conversions 44
3.10 Graphs and Plots 45
3.11 Statistical Analysis and Common Distributions 47
3.11.1 Definition of Measurement Data 47
3.11.2 Statistical Measurements 47
3.11.3 Statistical Analysis of Measurements 47
3.11.4 Probability 48
3.11.5 Sample and Population 49
3.11.6 Formulation of Mean and Variance for Direct Measurements 49
3.11.7 Mean and Variance Based on Samples 50
3.11.8 The Standard Deviation of the Mean 51
3.12 Formulation of the Standard Uncertainty and Average of Indirect Measurements 52
3.12.1 How to Determine the Measured Value and Random Error? 52
3.12.2 Repeated Measurements of One Single Quantity 52
3.12.3 Normal Distribution 53
3.12.4 Student's t-distribution 55
Multiple Choice Questions of this Chapter 60
4 Errors and their Sources 61
Introduction 61
4.1 Definition of the Error and Their Types 61
4.1.1 Systematic Errors 62
4.1.2 Random Errors 63
4.1.3 Components of Motion Error Assessment 63
4.2 Measurement Characteristics 63
4.2.1 Characterization of the Measurement 63
4.2.2 Resolution, Error Uncertainty, and Repeatability 64
4.2.3 Model of Measurement 67
4.3 Propagation of Errors 69
4.4 Sources of Errors 73
4.4.1 Static Errors and Dynamic Errors 73
4.5 Error Budget 77
4.5.1 Components of the Error Budget 77
4.5.2 Example of Erro
Acknowledgments xv
About the Author xvii
1 Fundamental Units and Constants in Metrology 1
1.1 Introduction 1
1.2 Current Definitions of the Main SI Units 6
1.3 New Definition of Seven Base Units of the SI 6
1.4 Derived International System (SI) Units 7
1.5 SI Conversion 7
1.6 Fundamental Constants 8
1.7 Common Measurements 9
1.8 Principles and Practices of Traceability 10
1.8.1 Definition of Traceability 10
1.8.2 Accreditation and Conformity Assessment 11
Multiple Choice Questions of this Chapter 12
References 12
2 Scales of Metrology 13
2.1 Introduction to Practical Metrology across All Scales 13
2.2 Nanometrology 14
2.2.1 Introduction and Need in Industry 14
2.2.2 Definition of Nanometrology 15
2.2.3 Importance of Nanometrology in Science and Technology 15
2.3 Standards 18
2.4 Micrometrology 22
2.4.1 Introduction and Need in Industry 22
2.4.2 Definition of Micrometrology 22
2.4.3 Examples of Micrometrology of Microparts 22
2.5 Macroscale Metrology 23
2.5.1 Standards 25
2.6 Large-Scale Metrology and Large-Volume Metrology 29
2.6.1 Introduction and Need in Industry 29
2.6.2 Definition 30
2.6.3 Verification Standards 32
2.7 Instruments Techniques 34
2.7.1 Large Coordinate Measuring Machines 35
2.7.2 Laser Trackers 35
2.7.3 Theodolite 35
Multiple Choice Questions of this Chapter 37
References 37
3 Applied Math and Statistics 39
3.1 Introduction 39
3.2 Scientific and Engineering Notation 39
3.3 Imperial/Metric Conversions 40
3.4 Ratio 41
3.5 Linear Interpolation 42
3.6 Number Bases 42
3.7 Significant Figures, Rounding, and Truncation 43
3.8 Geometry and Volumes 44
3.8.1 Perimeter 44
3.8.2 Volume and Area 44
3.9 Angular Conversions 44
3.10 Graphs and Plots 45
3.11 Statistical Analysis and Common Distributions 47
3.11.1 Definition of Measurement Data 47
3.11.2 Statistical Measurements 47
3.11.3 Statistical Analysis of Measurements 47
3.11.4 Probability 48
3.11.5 Sample and Population 49
3.11.6 Formulation of Mean and Variance for Direct Measurements 49
3.11.7 Mean and Variance Based on Samples 50
3.11.8 The Standard Deviation of the Mean 51
3.12 Formulation of the Standard Uncertainty and Average of Indirect Measurements 52
3.12.1 How to Determine the Measured Value and Random Error? 52
3.12.2 Repeated Measurements of One Single Quantity 52
3.12.3 Normal Distribution 53
3.12.4 Student's t-distribution 55
Multiple Choice Questions of this Chapter 60
4 Errors and their Sources 61
Introduction 61
4.1 Definition of the Error and Their Types 61
4.1.1 Systematic Errors 62
4.1.2 Random Errors 63
4.1.3 Components of Motion Error Assessment 63
4.2 Measurement Characteristics 63
4.2.1 Characterization of the Measurement 63
4.2.2 Resolution, Error Uncertainty, and Repeatability 64
4.2.3 Model of Measurement 67
4.3 Propagation of Errors 69
4.4 Sources of Errors 73
4.4.1 Static Errors and Dynamic Errors 73
4.5 Error Budget 77
4.5.1 Components of the Error Budget 77
4.5.2 Example of Erro
Preface xiii
Acknowledgments xv
About the Author xvii
1 Fundamental Units and Constants in Metrology 1
1.1 Introduction 1
1.2 Current Definitions of the Main SI Units 6
1.3 New Definition of Seven Base Units of the SI 6
1.4 Derived International System (SI) Units 7
1.5 SI Conversion 7
1.6 Fundamental Constants 8
1.7 Common Measurements 9
1.8 Principles and Practices of Traceability 10
1.8.1 Definition of Traceability 10
1.8.2 Accreditation and Conformity Assessment 11
Multiple Choice Questions of this Chapter 12
References 12
2 Scales of Metrology 13
2.1 Introduction to Practical Metrology across All Scales 13
2.2 Nanometrology 14
2.2.1 Introduction and Need in Industry 14
2.2.2 Definition of Nanometrology 15
2.2.3 Importance of Nanometrology in Science and Technology 15
2.3 Standards 18
2.4 Micrometrology 22
2.4.1 Introduction and Need in Industry 22
2.4.2 Definition of Micrometrology 22
2.4.3 Examples of Micrometrology of Microparts 22
2.5 Macroscale Metrology 23
2.5.1 Standards 25
2.6 Large-Scale Metrology and Large-Volume Metrology 29
2.6.1 Introduction and Need in Industry 29
2.6.2 Definition 30
2.6.3 Verification Standards 32
2.7 Instruments Techniques 34
2.7.1 Large Coordinate Measuring Machines 35
2.7.2 Laser Trackers 35
2.7.3 Theodolite 35
Multiple Choice Questions of this Chapter 37
References 37
3 Applied Math and Statistics 39
3.1 Introduction 39
3.2 Scientific and Engineering Notation 39
3.3 Imperial/Metric Conversions 40
3.4 Ratio 41
3.5 Linear Interpolation 42
3.6 Number Bases 42
3.7 Significant Figures, Rounding, and Truncation 43
3.8 Geometry and Volumes 44
3.8.1 Perimeter 44
3.8.2 Volume and Area 44
3.9 Angular Conversions 44
3.10 Graphs and Plots 45
3.11 Statistical Analysis and Common Distributions 47
3.11.1 Definition of Measurement Data 47
3.11.2 Statistical Measurements 47
3.11.3 Statistical Analysis of Measurements 47
3.11.4 Probability 48
3.11.5 Sample and Population 49
3.11.6 Formulation of Mean and Variance for Direct Measurements 49
3.11.7 Mean and Variance Based on Samples 50
3.11.8 The Standard Deviation of the Mean 51
3.12 Formulation of the Standard Uncertainty and Average of Indirect Measurements 52
3.12.1 How to Determine the Measured Value and Random Error? 52
3.12.2 Repeated Measurements of One Single Quantity 52
3.12.3 Normal Distribution 53
3.12.4 Student's t-distribution 55
Multiple Choice Questions of this Chapter 60
4 Errors and their Sources 61
Introduction 61
4.1 Definition of the Error and Their Types 61
4.1.1 Systematic Errors 62
4.1.2 Random Errors 63
4.1.3 Components of Motion Error Assessment 63
4.2 Measurement Characteristics 63
4.2.1 Characterization of the Measurement 63
4.2.2 Resolution, Error Uncertainty, and Repeatability 64
4.2.3 Model of Measurement 67
4.3 Propagation of Errors 69
4.4 Sources of Errors 73
4.4.1 Static Errors and Dynamic Errors 73
4.5 Error Budget 77
4.5.1 Components of the Error Budget 77
4.5.2 Example of Erro
Acknowledgments xv
About the Author xvii
1 Fundamental Units and Constants in Metrology 1
1.1 Introduction 1
1.2 Current Definitions of the Main SI Units 6
1.3 New Definition of Seven Base Units of the SI 6
1.4 Derived International System (SI) Units 7
1.5 SI Conversion 7
1.6 Fundamental Constants 8
1.7 Common Measurements 9
1.8 Principles and Practices of Traceability 10
1.8.1 Definition of Traceability 10
1.8.2 Accreditation and Conformity Assessment 11
Multiple Choice Questions of this Chapter 12
References 12
2 Scales of Metrology 13
2.1 Introduction to Practical Metrology across All Scales 13
2.2 Nanometrology 14
2.2.1 Introduction and Need in Industry 14
2.2.2 Definition of Nanometrology 15
2.2.3 Importance of Nanometrology in Science and Technology 15
2.3 Standards 18
2.4 Micrometrology 22
2.4.1 Introduction and Need in Industry 22
2.4.2 Definition of Micrometrology 22
2.4.3 Examples of Micrometrology of Microparts 22
2.5 Macroscale Metrology 23
2.5.1 Standards 25
2.6 Large-Scale Metrology and Large-Volume Metrology 29
2.6.1 Introduction and Need in Industry 29
2.6.2 Definition 30
2.6.3 Verification Standards 32
2.7 Instruments Techniques 34
2.7.1 Large Coordinate Measuring Machines 35
2.7.2 Laser Trackers 35
2.7.3 Theodolite 35
Multiple Choice Questions of this Chapter 37
References 37
3 Applied Math and Statistics 39
3.1 Introduction 39
3.2 Scientific and Engineering Notation 39
3.3 Imperial/Metric Conversions 40
3.4 Ratio 41
3.5 Linear Interpolation 42
3.6 Number Bases 42
3.7 Significant Figures, Rounding, and Truncation 43
3.8 Geometry and Volumes 44
3.8.1 Perimeter 44
3.8.2 Volume and Area 44
3.9 Angular Conversions 44
3.10 Graphs and Plots 45
3.11 Statistical Analysis and Common Distributions 47
3.11.1 Definition of Measurement Data 47
3.11.2 Statistical Measurements 47
3.11.3 Statistical Analysis of Measurements 47
3.11.4 Probability 48
3.11.5 Sample and Population 49
3.11.6 Formulation of Mean and Variance for Direct Measurements 49
3.11.7 Mean and Variance Based on Samples 50
3.11.8 The Standard Deviation of the Mean 51
3.12 Formulation of the Standard Uncertainty and Average of Indirect Measurements 52
3.12.1 How to Determine the Measured Value and Random Error? 52
3.12.2 Repeated Measurements of One Single Quantity 52
3.12.3 Normal Distribution 53
3.12.4 Student's t-distribution 55
Multiple Choice Questions of this Chapter 60
4 Errors and their Sources 61
Introduction 61
4.1 Definition of the Error and Their Types 61
4.1.1 Systematic Errors 62
4.1.2 Random Errors 63
4.1.3 Components of Motion Error Assessment 63
4.2 Measurement Characteristics 63
4.2.1 Characterization of the Measurement 63
4.2.2 Resolution, Error Uncertainty, and Repeatability 64
4.2.3 Model of Measurement 67
4.3 Propagation of Errors 69
4.4 Sources of Errors 73
4.4.1 Static Errors and Dynamic Errors 73
4.5 Error Budget 77
4.5.1 Components of the Error Budget 77
4.5.2 Example of Erro