Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
Volume I Materials Physics - Materials Mechanics. Volume II Physical Design - Reliability and Packaging
Herausgeber: Suhir, Ephraim; Lee, Y. C.; Wong, C. P.
Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
Volume I Materials Physics - Materials Mechanics. Volume II Physical Design - Reliability and Packaging
Herausgeber: Suhir, Ephraim; Lee, Y. C.; Wong, C. P.
- Broschiertes Buch
- Merkliste
- Auf die Merkliste
- Bewerten Bewerten
- Teilen
- Produkt teilen
- Produkterinnerung
- Produkterinnerung
Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging is the first comprehensive reference to collect and present the most, up-to-date, in-depth, practical and easy-to-use information on the physics, mechanics, reliability and packaging of micro- and opto-electronic materials, assemblies, structures and systems. The chapters in these two volumes contain summaries of the state-of-the-art and present new information on recently developed important methods or devices. Furthermore, practical recommendations are offered on how to successfully apply…mehr
- Ephraim Suhir (Volume ed.) / Y.C. Lee / C.P. WongMicro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging415,99 €
- HemmentPerspectives, Science and Technologies for Novel Silicon on Insulator Devices42,99 €
- Advances in Solid State Physics168,99 €
- Advances in Solid State Physics148,99 €
- ChoykeSilicon Carbide249,99 €
- Jan KorvinkMEMS: A Practical Guide of Design, Analysis, and Applications147,99 €
- Masanori Okuyama / Yoshihiro Ishibashi (eds.)Ferroelectric Thin Films166,99 €
-
-
-
Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
- Produktdetails
- Verlag: Springer US / Springer US, New York, N.Y.
- Softcover reprint of the original 1st ed. 2007
- Seitenzahl: 1528
- Erscheinungstermin: 23. August 2016
- Englisch
- Abmessung: 254mm x 178mm x 82mm
- Gewicht: 2819g
- ISBN-13: 9781489978851
- ISBN-10: 1489978852
- Artikelnr.: 48943237
- Herstellerkennzeichnung
- Books on Demand GmbH
- In de Tarpen 42
- 22848 Norderstedt
- info@bod.de
- 040 53433511
- Verlag: Springer US / Springer US, New York, N.Y.
- Softcover reprint of the original 1st ed. 2007
- Seitenzahl: 1528
- Erscheinungstermin: 23. August 2016
- Englisch
- Abmessung: 254mm x 178mm x 82mm
- Gewicht: 2819g
- ISBN-13: 9781489978851
- ISBN-10: 1489978852
- Artikelnr.: 48943237
- Herstellerkennzeichnung
- Books on Demand GmbH
- In de Tarpen 42
- 22848 Norderstedt
- info@bod.de
- 040 53433511
Materials Physics.
Polymer Materials Characterization, Modeling and Application.
Thermo
Optic Effects in Polymer Bragg Gratings.
Adhesives for Micro
and Opto
Electronics Applications: Chemistry, Reliability, Mechanics.
Multi
stages Peel Tests and Evaluation of Interfacial Adhesion Strength Between Brittle Thin Film and Polymer Substrate.
Adhesion and Fracture of Interfaces in Microelectronic Packaging.
The Research Status of Isotropic Electrically Conductive Adhesives.
Electrically Conductive Adhesives.
Adhesive Bonding of Passive Optical Components.
Photorefractive Materials and Devices for Passive Components in WDM Systems.
Advanced Substrate Materials for Power Electronics.
Carbon nanotube Based Interconnect Technology: Opportunities and Challenges.
Materials Mechanics.
Thermal Stress Modeling in Micro
and Opto
Electronics: Review and Extension.
Area Array Technology for High Reliability Applications.
How to make an Opto
Electronic Device into a Product: Role of Accelerated Life Testing.
High
speed Tensile Testing of Optical Fibers
New Understanding for Reliability Prediction.
Uncertainty Modeling in Fiber
Optic Packages.
Multiphysics modelling and optimisation technology for design and reliability of microstystems: Review.
Application of Moire Interferometry to Strain Analysis of PCB Deformations at Low Temperatures.
Characterization of Stresses and Strains in Microelectronics and Photonics Devices Using Photomechanics Methods.
Analysis of Reliability of IC Packages Using Fracture Mechanics Approach.
A Methodology for an Integrated (Electrical/Mechanical) Design of PWBA.
Nonlinear Dynamic Response of Micro
Electronic Structures to Shock Loading.
Physical Design.
Wafer Level Underfill.
The Wirebonded Interconnect: A Mainstay for Electronics.
Metallurgical Interconnections for Extreme High and Low Temperature Environments.
Accelerated Testing for Optoelectronics.
Passive
alignment of Optical Fiber in a V
groove with Low Viscosity Epoxy Flow.
Volume II: Reliability and Packaging.
Fundamental Concepts of Reliability and Stress Testing.
Micro
Deformation Analysis and Reliability Estimation of Micro
Components by Means of NanoDAC Technique.
Packaging and Reliability for Foundry
Fabricated MEMS.
Reliability in Mobile Electronic Productions.
Dynamic of the Physical Reliability of Photonic Materials.
Durability of Packaged Nanostructures: Laser Diode Packages, A Case Study.
Reliability of VCSEL Package Coupling to Optoelectronic Circuit Boards.
Fatigue Life Assessment for Lead
Free Solder Joints.
Reliability of High Density Lead
Free Assemblies Under Shock
loading Conditions.
Design
for
Reliability Methodology for Modeling Lead
Free Solder Materials and Solder Joint Reliability Performance.
Die Attach Quality Testing by Structure Function Evaluation.
The Mechanical Behavior of Flip Chip Packages Under Thermal Loading.
Li Li Stress Analysis on Processed Silicon Wafer and Packaged Micro
device.
Metallurgy, Processes and Reliability of Lead
Free Solder Inconnects.
Materials Physics.
Polymer Materials Characterization, Modeling and Application.
Thermo
Optic Effects in Polymer Bragg Gratings.
Adhesives for Micro
and Opto
Electronics Applications: Chemistry, Reliability, Mechanics.
Multi
stages Peel Tests and Evaluation of Interfacial Adhesion Strength Between Brittle Thin Film and Polymer Substrate.
Adhesion and Fracture of Interfaces in Microelectronic Packaging.
The Research Status of Isotropic Electrically Conductive Adhesives.
Electrically Conductive Adhesives.
Adhesive Bonding of Passive Optical Components.
Photorefractive Materials and Devices for Passive Components in WDM Systems.
Advanced Substrate Materials for Power Electronics.
Carbon nanotube Based Interconnect Technology: Opportunities and Challenges.
Materials Mechanics.
Thermal Stress Modeling in Micro
and Opto
Electronics: Review and Extension.
Area Array Technology for High Reliability Applications.
How to make an Opto
Electronic Device into a Product: Role of Accelerated Life Testing.
High
speed Tensile Testing of Optical Fibers
New Understanding for Reliability Prediction.
Uncertainty Modeling in Fiber
Optic Packages.
Multiphysics modelling and optimisation technology for design and reliability of microstystems: Review.
Application of Moire Interferometry to Strain Analysis of PCB Deformations at Low Temperatures.
Characterization of Stresses and Strains in Microelectronics and Photonics Devices Using Photomechanics Methods.
Analysis of Reliability of IC Packages Using Fracture Mechanics Approach.
A Methodology for an Integrated (Electrical/Mechanical) Design of PWBA.
Nonlinear Dynamic Response of Micro
Electronic Structures to Shock Loading.
Physical Design.
Wafer Level Underfill.
The Wirebonded Interconnect: A Mainstay for Electronics.
Metallurgical Interconnections for Extreme High and Low Temperature Environments.
Accelerated Testing for Optoelectronics.
Passive
alignment of Optical Fiber in a V
groove with Low Viscosity Epoxy Flow.
Volume II: Reliability and Packaging.
Fundamental Concepts of Reliability and Stress Testing.
Micro
Deformation Analysis and Reliability Estimation of Micro
Components by Means of NanoDAC Technique.
Packaging and Reliability for Foundry
Fabricated MEMS.
Reliability in Mobile Electronic Productions.
Dynamic of the Physical Reliability of Photonic Materials.
Durability of Packaged Nanostructures: Laser Diode Packages, A Case Study.
Reliability of VCSEL Package Coupling to Optoelectronic Circuit Boards.
Fatigue Life Assessment for Lead
Free Solder Joints.
Reliability of High Density Lead
Free Assemblies Under Shock
loading Conditions.
Design
for
Reliability Methodology for Modeling Lead
Free Solder Materials and Solder Joint Reliability Performance.
Die Attach Quality Testing by Structure Function Evaluation.
The Mechanical Behavior of Flip Chip Packages Under Thermal Loading.
Li Li Stress Analysis on Processed Silicon Wafer and Packaged Micro
device.
Metallurgy, Processes and Reliability of Lead
Free Solder Inconnects.