Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
Volume I Materials Physics - Materials Mechanics. Volume II Physical Design - Reliability and Packaging
Herausgeber: Suhir, Ephraim; Lee, Y. C.; Wong, C. P.
Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
Volume I Materials Physics - Materials Mechanics. Volume II Physical Design - Reliability and Packaging
Herausgeber: Suhir, Ephraim; Lee, Y. C.; Wong, C. P.
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Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging is the first comprehensive reference to collect and present the most, up-to-date, in-depth, practical and easy-to-use information on the physics, mechanics, reliability and packaging of micro- and opto-electronic materials, assemblies, structures and systems. The chapters in these two volumes contain summaries of the state-of-the-art and present new information on recently developed important methods or devices. Furthermore, practical recommendations are offered on how to successfully apply…mehr
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Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging is the first comprehensive reference to collect and present the most, up-to-date, in-depth, practical and easy-to-use information on the physics, mechanics, reliability and packaging of micro- and opto-electronic materials, assemblies, structures and systems. The chapters in these two volumes contain summaries of the state-of-the-art and present new information on recently developed important methods or devices. Furthermore, practical recommendations are offered on how to successfully apply current knowledge and recently developed technology to design, manufacture and operate viable, reliable and cost-effective electronic components or photonic devices. The emphasis is on the science and engineering of electronic and photonic packaging, on physical design problems, challenges and solutions. Volume I focuses on physics and mechanics of micro- and opto-electronic structures and systems, i.e., on the science underpinnings of engineering methods and approaches used in microelectronics and photonics. Volume II deals with various practical aspects of reliability and packaging of micro- and opto-electronic systems. Internationally recognized experts and world leaders in particular areas of this branch of applied science and engineering contributed to the book.
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Produktdetails
- Produktdetails
- Verlag: Springer US / Springer US, New York, N.Y.
- Softcover reprint of the original 1st ed. 2007
- Seitenzahl: 1528
- Erscheinungstermin: 23. August 2016
- Englisch
- Abmessung: 254mm x 178mm x 82mm
- Gewicht: 2819g
- ISBN-13: 9781489978851
- ISBN-10: 1489978852
- Artikelnr.: 48943237
- Herstellerkennzeichnung Die Herstellerinformationen sind derzeit nicht verfügbar.
- Verlag: Springer US / Springer US, New York, N.Y.
- Softcover reprint of the original 1st ed. 2007
- Seitenzahl: 1528
- Erscheinungstermin: 23. August 2016
- Englisch
- Abmessung: 254mm x 178mm x 82mm
- Gewicht: 2819g
- ISBN-13: 9781489978851
- ISBN-10: 1489978852
- Artikelnr.: 48943237
- Herstellerkennzeichnung Die Herstellerinformationen sind derzeit nicht verfügbar.
Dr. Ephraim Suhir is Distinguished Member of Technical Staff (retired), Basic Research, Physical Sciences and Engineering Research Division, Bell Labs, Murray Hill, NJ. He is currently on the faculty of the Electrical Engineering Department, University of California, Santa Cruz, CA and the Department of Mechanical Engineering, University of Maryland, College Park, MD. Dr. Suhir is Fellow of the American Physical Society (APS), the Institute of Electrical and Electronics Engineers (IEEE), the American Society of Mechanical Engineers (ASME), and the Society of Plastics Engineers (SPE). He is co-founder (with Dr. Peter Engel) of the ASME Journal of Electronic Packaging and served as its Technical Editor for eight years (1993-2001). He has received numerous distinguished service and professional awards, including 2004 ASME Worcester Read Warner Medal for outstanding contributions to the permanent literature of engineering; 2001 IMAPS John A. Wagnon Technical Achievement Award for outstanding contributions to the technical knowledge of the microelectronics, optoelectronics, and packaging industry; 2000 IEEE-CPMT Outstanding Sustained Technical Contribution Award for outstanding, sustained and continuing contributions to the technologies in fields encompassed by the CPMT Society; 2000 SPE International Engineering/Technology (Fred O. Conley) Award for outstanding pioneering and continuing contributions to plastics engineering; and 1999 ASME and Pi-Tau-Sigma Charles Russ Richards Memorial Award for outstanding contributions to mechanical engineering. Prof. C. P. Wong is a Regents' Professor and the Charles Smithgall Institute Endowed Chair at the School of Materials Science and Engineering at Georgia Institute of technology. After his doctoral study, he was awarded a two-year postdoctoral fellowship with Nobel Laureate Professor Henry Taube at Stanford University. He joined AT&T Bell Laboratories in 1977 as a member of the technical staff and in 1992, he was elected as an AT&T Bell Laboratories Fellow for his fundamental contributions to low-cost high performance plastic packaging of semiconductors. Since 1996, he is a Professor at the School of Materials Science and Engineering at the Georgia Institute of Technology. He has received many awards, among those, the AT&T Bell Labs Fellow Award in 1992, the IEEE CPMT Society Outstanding and Best Paper Awards in 1990, 1991, 1994, 1996, 1998, 2002, the IEEE CPMT Society Outstanding Sustained Technical Contributions Award in 1995, the IEEE Third Millennium Medal in 2000, the IEEE EAB Education Award in 2001, the IEEE CPMT Society Exceptional Technical Contributions Award in 2002 and the IEEE Components, Packaging and Manufacturing Technology Field Award in 2006. Dr. Wong is a Fellow of the IEEE, AIC, and AT&T Bell Labs, and was the technical vice president (1990 &1991), and the president of the IEEE-CPMT Society (1992 &1993). He was elected a member of the National Academy of Engineering in 2000. Professor Y. C. Lee is a Professor of Mechanical Engineering. He was the Chair of ASME Electronic and Photonic Packaging Division (EPPD) from 2004 to 2005. From 1993 to 2002, he was an Associate Director of the Center for Advanced Manufacturing and Packaging of Microwave, Optical and Digital Electronics, University of Colorado at Boulder. Prior to joining the University in 1989, he was a Member of Technical Staff at AT&T Bell Laboratories, Murray Hill, New Jersey. Dr. Lee was an Associated Editor of ASME Journal of Electronic Packaging from 2001 to 2004 and a Guest Editor for IEEE Transaction on Advanced Packaging in 2003 and 2005. He has received several awards: ASME Fellow, December 2002, Presidential Young Investigator (National Science Foundation, 1990), Outstanding Young Manufacturing Engineer Award (SME, 1992), Outstanding Paper Award (IEEE-ECTC, 1991), Outstanding Paper Award (ASME J. of Electronic Packaging, 1993), IEEE Transactions on Advanced Packaging Honorable Mention Paper Award, 2003
Volume I: Physics, Mechanics and Design.
Materials Physics.
Polymer Materials Characterization, Modeling and Application.
Thermo
Optic Effects in Polymer Bragg Gratings.
Adhesives for Micro
and Opto
Electronics Applications: Chemistry, Reliability, Mechanics.
Multi
stages Peel Tests and Evaluation of Interfacial Adhesion Strength Between Brittle Thin Film and Polymer Substrate.
Adhesion and Fracture of Interfaces in Microelectronic Packaging.
The Research Status of Isotropic Electrically Conductive Adhesives.
Electrically Conductive Adhesives.
Adhesive Bonding of Passive Optical Components.
Photorefractive Materials and Devices for Passive Components in WDM Systems.
Advanced Substrate Materials for Power Electronics.
Carbon nanotube Based Interconnect Technology: Opportunities and Challenges.
Materials Mechanics.
Thermal Stress Modeling in Micro
and Opto
Electronics: Review and Extension.
Area Array Technology for High Reliability Applications.
How to make an Opto
Electronic Device into a Product: Role of Accelerated Life Testing.
High
speed Tensile Testing of Optical Fibers
New Understanding for Reliability Prediction.
Uncertainty Modeling in Fiber
Optic Packages.
Multiphysics modelling and optimisation technology for design and reliability of microstystems: Review.
Application of Moire Interferometry to Strain Analysis of PCB Deformations at Low Temperatures.
Characterization of Stresses and Strains in Microelectronics and Photonics Devices Using Photomechanics Methods.
Analysis of Reliability of IC Packages Using Fracture Mechanics Approach.
A Methodology for an Integrated (Electrical/Mechanical) Design of PWBA.
Nonlinear Dynamic Response of Micro
Electronic Structures to Shock Loading.
Physical Design.
Wafer Level Underfill.
The Wirebonded Interconnect: A Mainstay for Electronics.
Metallurgical Interconnections for Extreme High and Low Temperature Environments.
Accelerated Testing for Optoelectronics.
Passive
alignment of Optical Fiber in a V
groove with Low Viscosity Epoxy Flow.
Volume II: Reliability and Packaging.
Fundamental Concepts of Reliability and Stress Testing.
Micro
Deformation Analysis and Reliability Estimation of Micro
Components by Means of NanoDAC Technique.
Packaging and Reliability for Foundry
Fabricated MEMS.
Reliability in Mobile Electronic Productions.
Dynamic of the Physical Reliability of Photonic Materials.
Durability of Packaged Nanostructures: Laser Diode Packages, A Case Study.
Reliability of VCSEL Package Coupling to Optoelectronic Circuit Boards.
Fatigue Life Assessment for Lead
Free Solder Joints.
Reliability of High Density Lead
Free Assemblies Under Shock
loading Conditions.
Design
for
Reliability Methodology for Modeling Lead
Free Solder Materials and Solder Joint Reliability Performance.
Die Attach Quality Testing by Structure Function Evaluation.
The Mechanical Behavior of Flip Chip Packages Under Thermal Loading.
Li Li Stress Analysis on Processed Silicon Wafer and Packaged Micro
device.
Metallurgy, Processes and Reliability of Lead
Free Solder Inconnects.
Materials Physics.
Polymer Materials Characterization, Modeling and Application.
Thermo
Optic Effects in Polymer Bragg Gratings.
Adhesives for Micro
and Opto
Electronics Applications: Chemistry, Reliability, Mechanics.
Multi
stages Peel Tests and Evaluation of Interfacial Adhesion Strength Between Brittle Thin Film and Polymer Substrate.
Adhesion and Fracture of Interfaces in Microelectronic Packaging.
The Research Status of Isotropic Electrically Conductive Adhesives.
Electrically Conductive Adhesives.
Adhesive Bonding of Passive Optical Components.
Photorefractive Materials and Devices for Passive Components in WDM Systems.
Advanced Substrate Materials for Power Electronics.
Carbon nanotube Based Interconnect Technology: Opportunities and Challenges.
Materials Mechanics.
Thermal Stress Modeling in Micro
and Opto
Electronics: Review and Extension.
Area Array Technology for High Reliability Applications.
How to make an Opto
Electronic Device into a Product: Role of Accelerated Life Testing.
High
speed Tensile Testing of Optical Fibers
New Understanding for Reliability Prediction.
Uncertainty Modeling in Fiber
Optic Packages.
Multiphysics modelling and optimisation technology for design and reliability of microstystems: Review.
Application of Moire Interferometry to Strain Analysis of PCB Deformations at Low Temperatures.
Characterization of Stresses and Strains in Microelectronics and Photonics Devices Using Photomechanics Methods.
Analysis of Reliability of IC Packages Using Fracture Mechanics Approach.
A Methodology for an Integrated (Electrical/Mechanical) Design of PWBA.
Nonlinear Dynamic Response of Micro
Electronic Structures to Shock Loading.
Physical Design.
Wafer Level Underfill.
The Wirebonded Interconnect: A Mainstay for Electronics.
Metallurgical Interconnections for Extreme High and Low Temperature Environments.
Accelerated Testing for Optoelectronics.
Passive
alignment of Optical Fiber in a V
groove with Low Viscosity Epoxy Flow.
Volume II: Reliability and Packaging.
Fundamental Concepts of Reliability and Stress Testing.
Micro
Deformation Analysis and Reliability Estimation of Micro
Components by Means of NanoDAC Technique.
Packaging and Reliability for Foundry
Fabricated MEMS.
Reliability in Mobile Electronic Productions.
Dynamic of the Physical Reliability of Photonic Materials.
Durability of Packaged Nanostructures: Laser Diode Packages, A Case Study.
Reliability of VCSEL Package Coupling to Optoelectronic Circuit Boards.
Fatigue Life Assessment for Lead
Free Solder Joints.
Reliability of High Density Lead
Free Assemblies Under Shock
loading Conditions.
Design
for
Reliability Methodology for Modeling Lead
Free Solder Materials and Solder Joint Reliability Performance.
Die Attach Quality Testing by Structure Function Evaluation.
The Mechanical Behavior of Flip Chip Packages Under Thermal Loading.
Li Li Stress Analysis on Processed Silicon Wafer and Packaged Micro
device.
Metallurgy, Processes and Reliability of Lead
Free Solder Inconnects.
Volume I: Physics, Mechanics and Design.
Materials Physics.
Polymer Materials Characterization, Modeling and Application.
Thermo
Optic Effects in Polymer Bragg Gratings.
Adhesives for Micro
and Opto
Electronics Applications: Chemistry, Reliability, Mechanics.
Multi
stages Peel Tests and Evaluation of Interfacial Adhesion Strength Between Brittle Thin Film and Polymer Substrate.
Adhesion and Fracture of Interfaces in Microelectronic Packaging.
The Research Status of Isotropic Electrically Conductive Adhesives.
Electrically Conductive Adhesives.
Adhesive Bonding of Passive Optical Components.
Photorefractive Materials and Devices for Passive Components in WDM Systems.
Advanced Substrate Materials for Power Electronics.
Carbon nanotube Based Interconnect Technology: Opportunities and Challenges.
Materials Mechanics.
Thermal Stress Modeling in Micro
and Opto
Electronics: Review and Extension.
Area Array Technology for High Reliability Applications.
How to make an Opto
Electronic Device into a Product: Role of Accelerated Life Testing.
High
speed Tensile Testing of Optical Fibers
New Understanding for Reliability Prediction.
Uncertainty Modeling in Fiber
Optic Packages.
Multiphysics modelling and optimisation technology for design and reliability of microstystems: Review.
Application of Moire Interferometry to Strain Analysis of PCB Deformations at Low Temperatures.
Characterization of Stresses and Strains in Microelectronics and Photonics Devices Using Photomechanics Methods.
Analysis of Reliability of IC Packages Using Fracture Mechanics Approach.
A Methodology for an Integrated (Electrical/Mechanical) Design of PWBA.
Nonlinear Dynamic Response of Micro
Electronic Structures to Shock Loading.
Physical Design.
Wafer Level Underfill.
The Wirebonded Interconnect: A Mainstay for Electronics.
Metallurgical Interconnections for Extreme High and Low Temperature Environments.
Accelerated Testing for Optoelectronics.
Passive
alignment of Optical Fiber in a V
groove with Low Viscosity Epoxy Flow.
Volume II: Reliability and Packaging.
Fundamental Concepts of Reliability and Stress Testing.
Micro
Deformation Analysis and Reliability Estimation of Micro
Components by Means of NanoDAC Technique.
Packaging and Reliability for Foundry
Fabricated MEMS.
Reliability in Mobile Electronic Productions.
Dynamic of the Physical Reliability of Photonic Materials.
Durability of Packaged Nanostructures: Laser Diode Packages, A Case Study.
Reliability of VCSEL Package Coupling to Optoelectronic Circuit Boards.
Fatigue Life Assessment for Lead
Free Solder Joints.
Reliability of High Density Lead
Free Assemblies Under Shock
loading Conditions.
Design
for
Reliability Methodology for Modeling Lead
Free Solder Materials and Solder Joint Reliability Performance.
Die Attach Quality Testing by Structure Function Evaluation.
The Mechanical Behavior of Flip Chip Packages Under Thermal Loading.
Li Li Stress Analysis on Processed Silicon Wafer and Packaged Micro
device.
Metallurgy, Processes and Reliability of Lead
Free Solder Inconnects.
Materials Physics.
Polymer Materials Characterization, Modeling and Application.
Thermo
Optic Effects in Polymer Bragg Gratings.
Adhesives for Micro
and Opto
Electronics Applications: Chemistry, Reliability, Mechanics.
Multi
stages Peel Tests and Evaluation of Interfacial Adhesion Strength Between Brittle Thin Film and Polymer Substrate.
Adhesion and Fracture of Interfaces in Microelectronic Packaging.
The Research Status of Isotropic Electrically Conductive Adhesives.
Electrically Conductive Adhesives.
Adhesive Bonding of Passive Optical Components.
Photorefractive Materials and Devices for Passive Components in WDM Systems.
Advanced Substrate Materials for Power Electronics.
Carbon nanotube Based Interconnect Technology: Opportunities and Challenges.
Materials Mechanics.
Thermal Stress Modeling in Micro
and Opto
Electronics: Review and Extension.
Area Array Technology for High Reliability Applications.
How to make an Opto
Electronic Device into a Product: Role of Accelerated Life Testing.
High
speed Tensile Testing of Optical Fibers
New Understanding for Reliability Prediction.
Uncertainty Modeling in Fiber
Optic Packages.
Multiphysics modelling and optimisation technology for design and reliability of microstystems: Review.
Application of Moire Interferometry to Strain Analysis of PCB Deformations at Low Temperatures.
Characterization of Stresses and Strains in Microelectronics and Photonics Devices Using Photomechanics Methods.
Analysis of Reliability of IC Packages Using Fracture Mechanics Approach.
A Methodology for an Integrated (Electrical/Mechanical) Design of PWBA.
Nonlinear Dynamic Response of Micro
Electronic Structures to Shock Loading.
Physical Design.
Wafer Level Underfill.
The Wirebonded Interconnect: A Mainstay for Electronics.
Metallurgical Interconnections for Extreme High and Low Temperature Environments.
Accelerated Testing for Optoelectronics.
Passive
alignment of Optical Fiber in a V
groove with Low Viscosity Epoxy Flow.
Volume II: Reliability and Packaging.
Fundamental Concepts of Reliability and Stress Testing.
Micro
Deformation Analysis and Reliability Estimation of Micro
Components by Means of NanoDAC Technique.
Packaging and Reliability for Foundry
Fabricated MEMS.
Reliability in Mobile Electronic Productions.
Dynamic of the Physical Reliability of Photonic Materials.
Durability of Packaged Nanostructures: Laser Diode Packages, A Case Study.
Reliability of VCSEL Package Coupling to Optoelectronic Circuit Boards.
Fatigue Life Assessment for Lead
Free Solder Joints.
Reliability of High Density Lead
Free Assemblies Under Shock
loading Conditions.
Design
for
Reliability Methodology for Modeling Lead
Free Solder Materials and Solder Joint Reliability Performance.
Die Attach Quality Testing by Structure Function Evaluation.
The Mechanical Behavior of Flip Chip Packages Under Thermal Loading.
Li Li Stress Analysis on Processed Silicon Wafer and Packaged Micro
device.
Metallurgy, Processes and Reliability of Lead
Free Solder Inconnects.