L.-F. Chen, C. K. Ong, C. P. Neo

Microwave Electronics

Measurement and Materials Characterization

• Gebundenes Buch

Produktbeschreibung

Readers will find a concise introduction to microwave theory along with an outline of the methods used to characterize microwave material properties. This book includes in-depth coverage of both established and emerging techniques in microwave measurement. It also offers practical examples of the use of microwave materials across a wide range of fields as well as guidance on the application of microwave theory and the appropriate measurement techniques.

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The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems. Bringing together coverage of a broad range of techniques in one publication for the first time, this book:
_ Provides a comprehensive introduction to microwave theory and microwave measurement techniques.
_ Examines every aspect of microwave material properties, circuit design and applications.
_ Presents materials property characterisation methods along with a discussion of the underlying theory.
_ Outlines the importance of microwave absorbers in the reduction in noise levels in microwave circuits and their importance within defence industry applications.
_ Relates each measurement technique to its application across the fields of microwave engineering, high-speed electronics, remote sensing and the physical sciences.

This book will appeal to practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar. Senior students, researchers in microwave engineering and microelectronics and material scientists will also find this book a very useful reference.

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Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.

Produktdetails

• Verlag: Wiley & Sons
• 1. Auflage
• Seitenzahl: 552
• Erscheinungstermin: 16. April 2004
• Englisch
• Abmessung: 251mm x 194mm x 37mm
• Gewicht: 1325g
• ISBN-13: 9780470844922
• ISBN-10: 0470844922
• Artikelnr.: 11095842

Autorenporträt

L. F. Chen is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley. C. K. Ong is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley. C. P. Neo is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley. V. V. Varadan is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley. Vijay K. Varadan is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.

Inhaltsangabe

Preface.
1.  Electromagnetic Properties of Materials.
2.  Microwave Theory and Techniques for Materials Characterization.
3.  Reflection Methods.
4.  Transmission/Reflection Methods.
5.  Resonator Methods.
6.  Resonant-perturbation Methods.
7.  Planar-circuit Methods.
8. Measurements of Permittivity and Permeability Tensors.
9.  Measurement of Ferroelectric Materials.
10.  Microwave Measurement of Chiral Materials.
11.  Measurement of Microwave Electrical Transport Properties.
12.  Measurement of Dieletric Properties of Materials at High Temperatures.
Index.