Hans-Joachim Wunderlich (Hrsg.)

Models in Hardware Testing

Lecture Notes of the Forum in Honor of Christian Landrault
Herausgegeben:Wunderlich, Hans-Joachim

• Gebundenes Buch

Produktbeschreibung

Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.

Produktdetails

• Frontiers in Electronic Testing 43
• Verlag: Springer / Springer Netherlands
• Artikelnr. des Verlages: 12461295, 978-90-481-3281-2
• 2010 edition
• Seitenzahl: 257
• Erscheinungstermin: 7. Dezember 2009
• Englisch
• Abmessung: 241mm x 166mm x 25mm
• Gewicht: 520g
• ISBN-13: 9789048132812
• ISBN-10: 9048132819
• Artikelnr.: 26617623

Inhaltsangabe

Contributing Authors. Preface. To Christian: a Real Test & Taste Expert. From LAAS to LIRMM and Beyond. 1: Open Defects in Nanometer Technologies; J. Figueras, et al. 2: Models for Bridging Defects; M. Renovell, et al. 3: Models for Delay Faults; S. M. Reddy. 4: Fault Modeling for Simulation and ATPG; B. Becker, I. Polian. 5: Generalized Fault Modeling for Logic Diagnosis; H.-J. Wunderlich, S. Holst. 6: Models in Memory Testing, From functional testing to defect-based testing; S. Di Carlo, P. Prinetto. 7: Models for Power-Aware Testing; P. Girard, H.-J. Wunderlich. 8: Physical Fault Models and Fault Tolerance; J. Arlat, Y. Crouzet. Index.

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Contributing Authors. Preface. To Christian: a Real Test & Taste Expert. From LAAS to LIRMM and Beyond. 1: Open Defects in Nanometer Technologies; J. Figueras, et al. 2: Models for Bridging Defects; M. Renovell, et al. 3: Models for Delay Faults; S. M. Reddy. 4: Fault Modeling for Simulation and ATPG; B. Becker, I. Polian. 5: Generalized Fault Modeling for Logic Diagnosis; H.-J. Wunderlich, S. Holst. 6: Models in Memory Testing, From functional testing to defect-based testing; S. Di Carlo, P. Prinetto. 7: Models for Power-Aware Testing; P. Girard, H.-J. Wunderlich. 8: Physical Fault Models and Fault Tolerance; J. Arlat, Y. Crouzet. Index.