Modern Measurements
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The science of measurement and instrumentation is a multidisciplinary study. This book covers a wide range of important topics including fundamental measurement theory, sampling, system identification/signal processing, analog-to-digital conversion, sensors, soft- and hardware aspects of instrumentation, non-destructive testing, electromagnetic compatibility, reliability, and usability. With practical applications and downloadable application examples, including MATLAB codes, it provides valuable information for electrical and systems engineers, EE students, and measurement…mehr

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Produktbeschreibung
The science of measurement and instrumentation is a multidisciplinary study. This book covers a wide range of important topics including fundamental measurement theory, sampling, system identification/signal processing, analog-to-digital conversion, sensors, soft- and hardware aspects of instrumentation, non-destructive testing, electromagnetic compatibility, reliability, and usability. With practical applications and downloadable application examples, including MATLAB codes, it provides valuable information for electrical and systems engineers, EE students, and measurement professionals.
This book is a collection of chapters linked together by a logical framework aimed at exploring the modern role of the measurement science in both the technically most advanced applications and in everyday life

Provides a unique methodological approach to understanding modern measurements
Important methods and devices are presented in a synthetic and easy-to-understand way
Includes end-of-chapter exercises and solutions
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Autorenporträt
Alessandro Ferrero is a Professor at the Polytechnic University of Milan. He is a Fellow of the IEEE. Dario Petri is a Professor at the University of Trento. He is a Fellow of the IEEE. Paolo Carbone is a Professor at the University of Perugia. He is a Fellow of the IEEE and editor-in-chief of the international journal, ACTA IMEKO. Marcantonio Catelani is a Professor at the University of Florence. He is a member of the IEEE and Chair of IMEKO TC10 Technical diagnostics.