Modern RF and Microwave Measurement Techniques
Herausgeber: Ferrero, Andrea; Teppati, Valeria; Sayed, Mohamed
Modern RF and Microwave Measurement Techniques
Herausgeber: Ferrero, Andrea; Teppati, Valeria; Sayed, Mohamed
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A comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement, including practical advice on deployment challenges.
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A comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement, including practical advice on deployment challenges.
Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
Produktdetails
- Produktdetails
- Verlag: Cambridge University Press
- Seitenzahl: 474
- Erscheinungstermin: 14. Dezember 2018
- Englisch
- Abmessung: 250mm x 175mm x 30mm
- Gewicht: 992g
- ISBN-13: 9781107036413
- ISBN-10: 1107036410
- Artikelnr.: 37800844
- Verlag: Cambridge University Press
- Seitenzahl: 474
- Erscheinungstermin: 14. Dezember 2018
- Englisch
- Abmessung: 250mm x 175mm x 30mm
- Gewicht: 992g
- ISBN-13: 9781107036413
- ISBN-10: 1107036410
- Artikelnr.: 37800844
Part I. General Concepts: 1. Transmission lines and scattering parameters
Roger Pollard and Mohamed Sayed; 2. Microwave interconnections, probing,
and fixturing Leonard Hayden; Part II. Microwave Instrumentation: 3.
Microwave synthesizers Alexander Chenakin; 4. Real-time spectrum analysis
and time-correlated measurements applied to non-linear system
characterization Marcus Da Silva; 5. Vector network analyzers Mohamed Sayed
and Jon Martens; 6. Microwave power measurements Ronald Ginley; 7. Modular
systems for RF and microwave measurements Jin Bains; Part III. Linear
Measurements: 8. Two-port network analyzer calibration Andrea Ferrero; 9.
Multiport and differential S-parameter measurements Valeria Teppati and
Andrea Ferrero; 10. Noise figure characterization Nerea Otegi, Juan-Mari
Collantes and Mohamed Sayed; 11. TDR based S-parameters Peter J. Pupalaikis
and Kaviyesh Doshi; Part IV. Non-Linear Measurements: 12. Vector network
analysis for nonlinear systems Yves Rolain, Gerd Vandersteen and Maarten
Schoukens; 13. Load and source-pull techniques Valeria Teppati, Andrea
Ferrero and Gian Luigi Madonna; 14. Broadband signal measurements for
linearity optimization Marco Spirito and Mauro Marchetti; 15. Pulse and RF
measurement Anthony Parker.
Roger Pollard and Mohamed Sayed; 2. Microwave interconnections, probing,
and fixturing Leonard Hayden; Part II. Microwave Instrumentation: 3.
Microwave synthesizers Alexander Chenakin; 4. Real-time spectrum analysis
and time-correlated measurements applied to non-linear system
characterization Marcus Da Silva; 5. Vector network analyzers Mohamed Sayed
and Jon Martens; 6. Microwave power measurements Ronald Ginley; 7. Modular
systems for RF and microwave measurements Jin Bains; Part III. Linear
Measurements: 8. Two-port network analyzer calibration Andrea Ferrero; 9.
Multiport and differential S-parameter measurements Valeria Teppati and
Andrea Ferrero; 10. Noise figure characterization Nerea Otegi, Juan-Mari
Collantes and Mohamed Sayed; 11. TDR based S-parameters Peter J. Pupalaikis
and Kaviyesh Doshi; Part IV. Non-Linear Measurements: 12. Vector network
analysis for nonlinear systems Yves Rolain, Gerd Vandersteen and Maarten
Schoukens; 13. Load and source-pull techniques Valeria Teppati, Andrea
Ferrero and Gian Luigi Madonna; 14. Broadband signal measurements for
linearity optimization Marco Spirito and Mauro Marchetti; 15. Pulse and RF
measurement Anthony Parker.
Part I. General Concepts: 1. Transmission lines and scattering parameters
Roger Pollard and Mohamed Sayed; 2. Microwave interconnections, probing,
and fixturing Leonard Hayden; Part II. Microwave Instrumentation: 3.
Microwave synthesizers Alexander Chenakin; 4. Real-time spectrum analysis
and time-correlated measurements applied to non-linear system
characterization Marcus Da Silva; 5. Vector network analyzers Mohamed Sayed
and Jon Martens; 6. Microwave power measurements Ronald Ginley; 7. Modular
systems for RF and microwave measurements Jin Bains; Part III. Linear
Measurements: 8. Two-port network analyzer calibration Andrea Ferrero; 9.
Multiport and differential S-parameter measurements Valeria Teppati and
Andrea Ferrero; 10. Noise figure characterization Nerea Otegi, Juan-Mari
Collantes and Mohamed Sayed; 11. TDR based S-parameters Peter J. Pupalaikis
and Kaviyesh Doshi; Part IV. Non-Linear Measurements: 12. Vector network
analysis for nonlinear systems Yves Rolain, Gerd Vandersteen and Maarten
Schoukens; 13. Load and source-pull techniques Valeria Teppati, Andrea
Ferrero and Gian Luigi Madonna; 14. Broadband signal measurements for
linearity optimization Marco Spirito and Mauro Marchetti; 15. Pulse and RF
measurement Anthony Parker.
Roger Pollard and Mohamed Sayed; 2. Microwave interconnections, probing,
and fixturing Leonard Hayden; Part II. Microwave Instrumentation: 3.
Microwave synthesizers Alexander Chenakin; 4. Real-time spectrum analysis
and time-correlated measurements applied to non-linear system
characterization Marcus Da Silva; 5. Vector network analyzers Mohamed Sayed
and Jon Martens; 6. Microwave power measurements Ronald Ginley; 7. Modular
systems for RF and microwave measurements Jin Bains; Part III. Linear
Measurements: 8. Two-port network analyzer calibration Andrea Ferrero; 9.
Multiport and differential S-parameter measurements Valeria Teppati and
Andrea Ferrero; 10. Noise figure characterization Nerea Otegi, Juan-Mari
Collantes and Mohamed Sayed; 11. TDR based S-parameters Peter J. Pupalaikis
and Kaviyesh Doshi; Part IV. Non-Linear Measurements: 12. Vector network
analysis for nonlinear systems Yves Rolain, Gerd Vandersteen and Maarten
Schoukens; 13. Load and source-pull techniques Valeria Teppati, Andrea
Ferrero and Gian Luigi Madonna; 14. Broadband signal measurements for
linearity optimization Marco Spirito and Mauro Marchetti; 15. Pulse and RF
measurement Anthony Parker.