Andere Kunden interessierten sich auch für
![Multi-run Memory Tests for Pattern Sensitive Faults]( "Multi-run Memory Tests for Pattern Sensitive Faults")
Multi-run Memory Tests for Pattern Sensitive Faults37,99 €![Design Automation for Differential MOS Current-Mode Logic Circuits]( "Design Automation for Differential MOS Current-Mode Logic Circuits")
Design Automation for Differential MOS Current-Mode Logic Circuits103,99 €![Timing Performance of Nanometer Digital Circuits Under Process Variations]( "Timing Performance of Nanometer Digital Circuits Under Process Variations")
Timing Performance of Nanometer Digital Circuits Under Process Variations88,99 €![Security Policy in System-on-Chip Designs]( "Security Policy in System-on-Chip Designs")
Security Policy in System-on-Chip Designs37,99 €![Post-Silicon Validation and Debug]( "Post-Silicon Validation and Debug")
Post-Silicon Validation and Debug110,99 €![Fundamentals of Electromigration-Aware Integrated Circuit Design]( "Fundamentals of Electromigration-Aware Integrated Circuit Design")
Fundamentals of Electromigration-Aware Integrated Circuit Design88,99 €![Contactless VLSI Measurement and Testing Techniques]( "Contactless VLSI Measurement and Testing Techniques")
Contactless VLSI Measurement and Testing Techniques74,99 €
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.
Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;
Presents practical algorithms for design and implementation of efficient multi-run tests;
Demonstrates methods verified by analytical and experimental investigations.
Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;
Presents practical algorithms for design and implementation of efficient multi-run tests;
Demonstrates methods verified by analytical and experimental investigations.