Mit der hier besprochenen Methodik kann man die Genauigkeit computergesteuerter Prozesse und Transaktionen sicherstellen. Behandelt wird die computergestützte Steuerung, Datensammlung und -analyse, gestützt auf die fünfzehnjährige Erfahrung des Autors bei der Air Force und als Mitarbeiter der Six-Sigma-Initiative von General Electric. Die Ansätze sind allgemeiner Natur und deshalb vielseitig verwendbar. Vom FTP-Server von Wiley kann eine zugehörige Fehlermodellierungssoftware abgerufen werden; ein Lösungsheft ist erhältlich.
Mit der hier besprochenen Methodik kann man die Genauigkeit computergesteuerter Prozesse und Transaktionen sicherstellen. Behandelt wird die computergestützte Steuerung, Datensammlung und -analyse, gestützt auf die fünfzehnjährige Erfahrung des Autors bei der Air Force und als Mitarbeiter der Six-Sigma-Initiative von General Electric. Die Ansätze sind allgemeiner Natur und deshalb vielseitig verwendbar. Vom FTP-Server von Wiley kann eine zugehörige Fehlermodellierungssoftware abgerufen werden; ein Lösungsheft ist erhältlich.
Die Herstellerinformationen sind derzeit nicht verfügbar.
Autorenporträt
PATRICK H. GARRETT is an electrical engineering faculty member at the University of Cincinnati, where he has developed courses in manufacturing, controls, and process instrumentation. He holds several engineering degrees and has written five textbooks on instrumentation and process control that have been adopted internationally. He continues to be involved in long-term research projects, for both government and private sectors focused on performance advancement of information-intensive real-time systems.
Inhaltsangabe
Preface.
1. Process, Quantum, and Analytical Sensors.
1-0 Introduction.
1-1 Instrumentation Error Representation.
1-2 Temperature Sensors.
1-3 Mechanical Sensors.
1-4 Quantum Sensors.
1-5 Analytical Sensors.
Bibliography.
2. Instrumentation Amplifiers and Parameter Errors.
2-0 Introduction.
2-1 Device Temperature Characteristics.
2-2 Differential Amplifiers.
2-3 Operational Amplifiers.
2-4 Instrumentation Amplifiers.
2-5 Amplifier Parameter Error Evaluation.
Bibliography.
3. Active Filter Design with Nominal Error.
3-0 Introduction.
3-1 Lowpass Instrumentation Filters.
3-2 Active Filter Networks.
3-3 Filter Error Analysis.
3-4 Bandpass Instrumentation Filters.
Bibliography.
4. Linear Signal Conditioning to Six-Sigma Confidence.
4-0 Introduction.
4-1 Signal Conditioning Input Considerations.
4-2 Signal Quality Evaluation and Improvement.
4-3 DC, Sinusoidal, and Harmonic Signal Conditioning.
4-4 Redundant Signal Conditioning and Diagnostics.
Bibliography
5. Data Conversion Devices and Errors.
5-0 Introduction.
5-1 Analog Multiplexers.
5-2 Sample Holds.
5-3 Digital-to-Analog Converters.
5-4 Analog-to-Digital Converters.
Bibliography.
6. Sampling and Reconstruction with Intersample Error.
6-0 Introduction.
6-1 Sampled Data Theory.
6-2 Aliasing of Signal and Noise.
6-3 Step-Interpolated Data Intersample Error.
6-4 Output Signal Interpolation, Oversampling, and Digital Conditioning.
Bibliography.
7. Measurement and Control Instrumentation Error Analysis.
7-0 Introduction.
7-1 Low-Data-Rate Digital Control Instrumentation.
7-2 High-Data-Rate Video Acquisition.
7-3 Computer-Integrated Instrumentation Analysis Suite
Bibliography
8. Multisensor Architectures and Error Propagation.
8-0 Introduction.
8-1 Multisensor Fusion, Integration, and Error.
8-2 Sequential Multisensor Architecture.
8-3 Homogeneous Multisensor Architecture.
8-4 Heterogeneous Multisensor Architecture.
Bibliography.
9. Instrumentation System Integration and Interfaces.
9-0 Introduction.
9-1 System Integration and Interface Buses.
9-2 Instrument Serial Bus Interfaces.
9-3 Microwave Microscopy Virtual Instrument.
9-4 Analytical Instrumentation in Advanced Control.
2. Instrumentation Amplifiers and Parameter Errors.
2-0 Introduction.
2-1 Device Temperature Characteristics.
2-2 Differential Amplifiers.
2-3 Operational Amplifiers.
2-4 Instrumentation Amplifiers.
2-5 Amplifier Parameter Error Evaluation.
Bibliography.
3. Active Filter Design with Nominal Error.
3-0 Introduction.
3-1 Lowpass Instrumentation Filters.
3-2 Active Filter Networks.
3-3 Filter Error Analysis.
3-4 Bandpass Instrumentation Filters.
Bibliography.
4. Linear Signal Conditioning to Six-Sigma Confidence.
4-0 Introduction.
4-1 Signal Conditioning Input Considerations.
4-2 Signal Quality Evaluation and Improvement.
4-3 DC, Sinusoidal, and Harmonic Signal Conditioning.
4-4 Redundant Signal Conditioning and Diagnostics.
Bibliography
5. Data Conversion Devices and Errors.
5-0 Introduction.
5-1 Analog Multiplexers.
5-2 Sample Holds.
5-3 Digital-to-Analog Converters.
5-4 Analog-to-Digital Converters.
Bibliography.
6. Sampling and Reconstruction with Intersample Error.
6-0 Introduction.
6-1 Sampled Data Theory.
6-2 Aliasing of Signal and Noise.
6-3 Step-Interpolated Data Intersample Error.
6-4 Output Signal Interpolation, Oversampling, and Digital Conditioning.
Bibliography.
7. Measurement and Control Instrumentation Error Analysis.
7-0 Introduction.
7-1 Low-Data-Rate Digital Control Instrumentation.
7-2 High-Data-Rate Video Acquisition.
7-3 Computer-Integrated Instrumentation Analysis Suite
Bibliography
8. Multisensor Architectures and Error Propagation.
8-0 Introduction.
8-1 Multisensor Fusion, Integration, and Error.
8-2 Sequential Multisensor Architecture.
8-3 Homogeneous Multisensor Architecture.
8-4 Heterogeneous Multisensor Architecture.
Bibliography.
9. Instrumentation System Integration and Interfaces.
9-0 Introduction.
9-1 System Integration and Interface Buses.
9-2 Instrument Serial Bus Interfaces.
9-3 Microwave Microscopy Virtual Instrument.
9-4 Analytical Instrumentation in Advanced Control.
Bibliography.
Index.
Rezensionen
"Provides an instrumentation and system reference for computer-centered measurement systems." ( SciTech Book News , Vol. 26, No. 2, June 2002) "...coverage is comprehensive; it covers everything from the basics to the latest developments...well written and easy to follow...a good textbook for senior undergraduates, graduate students, ad for researchers." ( IEEE Instrumentation & Measurement Magazine , December 2002)
"...comprehensive...well-written and easy-to-follow.... It gives good background...to newcomers, as well as a good reference...a good textbook..." ( IEEE Instrumentation & Measurement Magazine , December 2002)
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