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Produktbild: Near-Field Characterization of Micro/Nano-Scaled Fluid Flows

Near-Field Characterization of Micro/Nano-Scaled Fluid Flows

Aus der Reihe Experimental Fluid Mechanics

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Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

18.04.2014

Verlag

Springer Berlin

Seitenzahl

156

Maße (L/B/H)

23,5/15,5/1 cm

Gewicht

260 g

Auflage

2011

Sprache

Englisch

ISBN

978-3-642-26737-6

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

18.04.2014

Verlag

Springer Berlin

Seitenzahl

156

Maße (L/B/H)

23,5/15,5/1 cm

Gewicht

260 g

Auflage

2011

Sprache

Englisch

ISBN

978-3-642-26737-6

Herstelleradresse

Springer-Verlag KG
Sachsenplatz 4-6
1201 Wien
AT

Email: GPSR Kontakt

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  • Produktbild: Near-Field Characterization of Micro/Nano-Scaled Fluid Flows
  • Preface
    1.         Introduction
    1.1       Definitions of near-field
    1.1.1        Evanescent wave penetration depth
    1.1.3    Photon penetration skin-depth into metal
    1.1.4    Penetration depth of no-slip boundary conditions
    1.1.5    Equilibrium height (hm) for small particles under near-field forces
    1.2          Synopsis
     
    2.         Total Internal Reflection Microscopy (TIRM)
    2.1       Principles and configuration of TIRM
    2.2       Ratiometric TIRM imaging analysis
    2. 3      Near-field applications of TIRM
    2.3.1    Near-wall hindered Brownian motion of nanoparticles
    2.3.2    Slip-flows in the near-field
    2.3.3    Cytoplasmic viscosity and intracellular vesicle sizes
     
    3.         Optical Serial Sectioning Microscopy (OSSM)3.1       Point spread functions (PSFs) under aberration-free design conditions
    3.2       Point spread functions (PSFs) under off-design conditions
    3.3       Principles of OSSM
    3.4       Near-field applications of OSSM
    3.4.1    Three-dimensional particle tracking velocimetry (PTV)
    3.4.2    Near-wall thermometry
    3.4.3    Near-field mixture concentration measurements
     
    4.         Confocal Laser Scanning Microscopy (CLSM)
    4.1       Principles of confocal imaging4.2       Microscopic imaging resolutions
    4.3       Confocal microscopic imaging resolutions
    4.4       Optical slicing thickness of confocal microscopy
    4.5       Confocal laser scanning microscopic particle imaging velocimetry (CLSM-PIV) system
    4.6       Near-field applications of CLSM-PIV
    4.6.1    Poiseuille flows in a microtube
    4.6.2    Microscale rotating Couette flows
    4.6.3    Moving bubbles in a microchannel
     
    5.         Surface Plasmon Resonance Microscopy (SPRM)
    5.1       Surface plasmon polaritons (SPPs)
    5.2       Dispersion of SPPs
    5.3.      Kretschmann’s three-layer configuration
    5.4       Surface plasmon resonance (SPR) reflectance5.5       Surface plasmon resonance microscopy (SPRM) imaging systems
    5.6       Selection of a prism for SPRM
    5.7       SPR reflectance imaging resolution
    5.8       Near-field applications of SPRM
    5.8.1    History and uses of SPRM
    5.8.2    Label-free mapping of microfluidic mixing fields
    5.8.3    Near-field mapping of salinity diffusion
    5.8.4    Dynamic monitoring of nanoparticle concentration profiles
    5.8.5    Unveiling the fingerprints of nanocrystalline self-assembly
    5.8.6    Near-wall thermometry
     
    6.         Reflection Interference Contrast Microscopy (RICM)
    6.1       Interference of plane waves
    6.2       Principles and practical issues of RICM6.3       Near-field applications of RICM
    6.3.1    Thin-film thickness measurements
    6.3.2    Electrohydrodynamic (EHD) control of thin liquid film
    6.3.3    Dynamic fingerprinting of live-cell focal contacts
     
    References

    1.         Introduction
    1.1       Definitions of near-field
    1.1.1        Evanescent wave penetration depth
    1.1.3    Photon penetration skin-depth into metal
    1.1.4    Penetration depth of no-slip boundary conditions
    1.1.5    Equilibrium height (hm) for small particles under near-field forces
    1.2          Synopsis
     
    2.         Total Internal Reflection Microscopy (TIRM)
    2.1       Principles and configuration of TIRM
    2.2       Ratiometric TIRM imaging analysis
    2. 3      Near-field applications of TIRM
    2.3.1    Near-wall hindered Brownian motion of nanoparticles
    2.3.2    Slip-flows in the near-field
    2.3.3    Cytoplasmic viscosity and intracellular vesicle sizes
     
    3.         Optical Serial Sectioning Microscopy (OSSM)3.1       Point spread functions (PSFs) under aberration-free design conditions
    3.2       Point spread functions (PSFs) under off-design conditions
    3.3       Principles of OSSM
    3.4       Near-field applications of OSSM
    3.4.1    Three-dimensional particle tracking velocimetry (PTV)
    3.4.2    Near-wall thermometry
    3.4.3    Near-field mixture concentration measurements
     
    4.         Confocal Laser Scanning Microscopy (CLSM)
    4.1       Principles of confocal imaging4.2       Microscopic imaging resolutions
    4.3       Confocal microscopic imaging resolutions
    4.4       Optical slicing thickness of confocal microscopy
    4.5       Confocal laser scanning microscopic particle imaging velocimetry (CLSM-PIV) system
    4.6       Near-field applications of CLSM-PIV
    4.6.1    Poiseuille flows in a microtube
    4.6.2    Microscale rotating Couette flows
    4.6.3    Moving bubbles in a microchannel
     
    5.         Surface Plasmon Resonance Microscopy (SPRM)
    5.1       Surface plasmon polaritons (SPPs)
    5.2       Dispersion of SPPs
    5.3.      Kretschmann’s three-layer configuration
    5.4       Surface plasmon resonance (SPR) reflectance5.5       Surface plasmon resonance microscopy (SPRM) imaging systems
    5.6       Selection of a prism for SPRM
    5.7       SPR reflectance imaging resolution
    5.8       Near-field applications of SPRM
    5.8.1    History and uses of SPRM
    5.8.2    Label-free mapping of microfluidic mixing fields
    5.8.3    Near-field mapping of salinity diffusion
    5.8.4    Dynamic monitoring of nanoparticle concentration profiles
    5.8.5    Unveiling the fingerprints of nanocrystalline self-assembly
    5.8.6    Near-wall thermometry
     
    6.         Reflection Interference Contrast Microscopy (RICM)
    6.1       Interference of plane waves
    6.2       Principles and practical issues of RICM6.3       Near-field applications of RICM
    6.3.1    Thin-film thickness measurements
    6.3.2    Electrohydrodynamic (EHD) control of thin liquid film
    6.3.3    Dynamic fingerprinting of live-cell focal contacts
     
    References

    3.1       Point spread functions (PSFs) under aberration-free design conditions
    3.2       Point spread functions (PSFs) under off-design conditions
    3.3       Principles of OSSM
    3.4       Near-field applications of OSSM
    3.4.1    Three-dimensional particle tracking velocimetry (PTV)
    3.4.2    Near-wall thermometry
    3.4.3    Near-field mixture concentration measurements
     
    4.         Confocal Laser Scanning Microscopy (CLSM)
    4.1       Principles of confocal imaging4.2       Microscopic imaging resolutions
    4.3       Confocal microscopic imaging resolutions
    4.4       Optical slicing thickness of confocal microscopy
    4.5       Confocal laser scanning microscopic particle imaging velocimetry (CLSM-PIV) system
    4.6       Near-field applications of CLSM-PIV
    4.6.1    Poiseuille flows in a microtube
    4.6.2    Microscale rotating Couette flows
    4.6.3    Moving bubbles in a microchannel
     
    5.         Surface Plasmon Resonance Microscopy (SPRM)
    5.1       Surface plasmon polaritons (SPPs)
    5.2       Dispersion of SPPs
    5.3.      Kretschmann’s three-layer configuration
    5.4       Surface plasmon resonance (SPR) reflectance5.5       Surface plasmon resonance microscopy (SPRM) imaging systems
    5.6       Selection of a prism for SPRM
    5.7       SPR reflectance imaging resolution
    5.8       Near-field applications of SPRM
    5.8.1    History and uses of SPRM
    5.8.2    Label-free mapping of microfluidic mixing fields
    5.8.3    Near-field mapping of salinity diffusion
    5.8.4    Dynamic monitoring of nanoparticle concentration profiles
    5.8.5    Unveiling the fingerprints of nanocrystalline self-assembly
    5.8.6    Near-wall thermometry
     
    6.         Reflection Interference Contrast Microscopy (RICM)
    6.1       Interference of plane waves
    6.2       Principles and practical issues of RICM6.3       Near-field applications of RICM
    6.3.1    Thin-film thickness measurements
    6.3.2    Electrohydrodynamic (EHD) control of thin liquid film
    6.3.3    Dynamic fingerprinting of live-cell focal contacts
     
    References

    4.2       Microscopic imaging resolutions
    4.3       Confocal microscopic imaging resolutions
    4.4       Optical slicing thickness of confocal microscopy
    4.5       Confocal laser scanning microscopic particle imaging velocimetry (CLSM-PIV) system
    4.6       Near-field applications of CLSM-PIV
    4.6.1    Poiseuille flows in a microtube
    4.6.2    Microscale rotating Couette flows
    4.6.3    Moving bubbles in a microchannel
     
    5.         Surface Plasmon Resonance Microscopy (SPRM)
    5.1       Surface plasmon polaritons (SPPs)
    5.2       Dispersion of SPPs
    5.3.      Kretschmann’s three-layer configuration
    5.4       Surface plasmon resonance (SPR) reflectance5.5       Surface plasmon resonance microscopy (SPRM) imaging systems
    5.6       Selection of a prism for SPRM
    5.7       SPR reflectance imaging resolution
    5.8       Near-field applications of SPRM
    5.8.1    History and uses of SPRM
    5.8.2    Label-free mapping of microfluidic mixing fields
    5.8.3    Near-field mapping of salinity diffusion
    5.8.4    Dynamic monitoring of nanoparticle concentration profiles
    5.8.5    Unveiling the fingerprints of nanocrystalline self-assembly
    5.8.6    Near-wall thermometry
     
    6.         Reflection Interference Contrast Microscopy (RICM)
    6.1       Interference of plane waves
    6.2       Principles and practical issues of RICM6.3       Near-field applications of RICM
    6.3.1    Thin-film thickness measurements
    6.3.2    Electrohydrodynamic (EHD) control of thin liquid film
    6.3.3    Dynamic fingerprinting of live-cell focal contacts
     
    References

    5.5       Surface plasmon resonance microscopy (SPRM) imaging systems
    5.6       Selection of a prism for SPRM
    5.7       SPR reflectance imaging resolution
    5.8       Near-field applications of SPRM
    5.8.1    History and uses of SPRM
    5.8.2    Label-free mapping of microfluidic mixing fields
    5.8.3    Near-field mapping of salinity diffusion
    5.8.4    Dynamic monitoring of nanoparticle concentration profiles
    5.8.5    Unveiling the fingerprints of nanocrystalline self-assembly
    5.8.6    Near-wall thermometry
     
    6.         Reflection Interference Contrast Microscopy (RICM)
    6.1       Interference of plane waves
    6.2       Principles and practical issues of RICM6.3       Near-field applications of RICM
    6.3.1    Thin-film thickness measurements
    6.3.2    Electrohydrodynamic (EHD) control of thin liquid film
    6.3.3    Dynamic fingerprinting of live-cell focal contacts
     
    References

    6.3       Near-field applications of RICM
    6.3.1    Thin-film thickness measurements
    6.3.2    Electrohydrodynamic (EHD) control of thin liquid film
    6.3.3    Dynamic fingerprinting of live-cell focal contacts
     
    References