Near-field Characterization of Photonic Nanodevices - Abashin, Maxim
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The increasing density of data transmission, speed of all-optical signal processing, and demand for higher resolution microscopy and spectroscopy stimulate the development of the nanophotonics. Near- field microscopy is not limited by light diffraction and thus it can achieve sufficiently subwavelength resolution. Therefore this approach is perfect for nanophotonic device characterization. Heterodyne detection allows resolution of the optical phase and improves signal-to-noise performance in near-field microscopy. The book describes a Heterodyne Near- field Scanning Optical Microscope (HNSOM)…mehr

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Produktbeschreibung
The increasing density of data transmission, speed of all-optical signal processing, and demand for higher resolution microscopy and spectroscopy stimulate the development of the nanophotonics. Near- field microscopy is not limited by light diffraction and thus it can achieve sufficiently subwavelength resolution. Therefore this approach is perfect for nanophotonic device characterization. Heterodyne detection allows resolution of the optical phase and improves signal-to-noise performance in near-field microscopy. The book describes a Heterodyne Near- field Scanning Optical Microscope (HNSOM) and applications of this approach to characterization of several classes of the photonic nanodevices.
Autorenporträt
Maxim Abashin received a B.S. and M.S. degrees from Moscow Institute of Physics and Technology (Russia), and Ph.D. degree in Photonics from the University of California, San Diego. His graduate research on near-field scanning optical microscopy (NSOM) and characterization of nanophotonic devices was supervised by Prof. Yeshaiahu Fainman.