Kenichi Shimizu, Tomoaki Mitani

New Horizons of Applied Scanning Electron Microscopy

• Gebundenes Buch

Produktbeschreibung

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.

---

Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.

Produktdetails

• Springer Series in Surface Sciences 45
• Verlag: Springer / Springer Berlin Heidelberg / Springer, Berlin
• Artikelnr. des Verlages: 12654512, 978-3-642-03159-5
• 2010
• Seitenzahl: 196
• Erscheinungstermin: 2. Dezember 2009
• Englisch
• Abmessung: 241mm x 160mm x 17mm
• Gewicht: 416g
• ISBN-13: 9783642031595
• ISBN-10: 3642031595
• Artikelnr.: 26899862

Inhaltsangabe

Introduction.- Imaging of Thin Films.- Applications of Scanning Electron Microscopy.- Concluding remarks.

Rezensionen

From the reviews: "The book is attractively presented, in hardcover with numerous illustrations. It is a text book doing little to disguise its academic spirit discussing its subject through a series of chapters covering the technical capabilities of FE-SEM within the materials science field. ... In conclusion, a well written book of interest to experienced material scientists. The book is a relevant resource for those in academic institutions and industry segments where high resolution scanning electron microscopy is employed." (Roland A. Fleck, Infocus Magazine, Issue 21, March, 2011)