Noise Analysis and Measurement for Active Pixel Sensor Readout Methods - Wu, Dali
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A detailed experimental and theoretical investigation of noise in both current mode and voltage mode amorphous silicon (a-Si) active pixel sensors (APS) has been performed. Both flicker (1/f) and thermal are considered in this study. The experimental result in this paper emphasizes the computation of the output noise variance. The theoretical analysis shows that the voltage mode APS has an advantage over the current mode APS in terms of the flicker noise due to the operation of the readout process. The experimental data are compared to the theoretical analysis and are in good agreement.

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Produktbeschreibung
A detailed experimental and theoretical investigation of noise in both current mode and voltage mode amorphous silicon (a-Si) active pixel sensors (APS) has been performed. Both flicker (1/f) and thermal are considered in this study. The experimental result in this paper emphasizes the computation of the output noise variance. The theoretical analysis shows that the voltage mode APS has an advantage over the current mode APS in terms of the flicker noise due to the operation of the readout process. The experimental data are compared to the theoretical analysis and are in good agreement.
Autorenporträt
Dali Wu obtained B.A.Sc. degree in 2008 and M.A.Sc degree in 2010, both in electrical engineering from University of Waterloo. His research projects included thin film electronics and x-ray medical imaging. Dali Wu is currently working at Aptina Imaging in California, U.S.A