Nonlinear Analysis of Thin-Walled Smart Structures - Zhang, Shun-Qi
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This book focuses on nonlinear finite element analysis of thin-walled smart structures integrated with piezoelectric materials. Two types of nonlinear phenomena are presented in the book, namely geometrical nonlinearity and material nonlinearity. Geometrical nonlinearity mainly results from large deformations and large rotations of structures. The book discusses various geometrically nonlinear theories including von Kármán type nonlinear theory, moderate rotation nonlinear theory, fully geometrically nonlinear theory with moderate rotations and large rotation nonlinear theory. The material…mehr

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Produktbeschreibung
This book focuses on nonlinear finite element analysis of thin-walled smart structures integrated with piezoelectric materials. Two types of nonlinear phenomena are presented in the book, namely geometrical nonlinearity and material nonlinearity. Geometrical nonlinearity mainly results from large deformations and large rotations of structures. The book discusses various geometrically nonlinear theories including von Kármán type nonlinear theory, moderate rotation nonlinear theory, fully geometrically nonlinear theory with moderate rotations and large rotation nonlinear theory. The material nonlinearity mainly considered in this book is electroelastic coupled nonlinearity resulting from large driving electric field. This book will be a good reference for students and researchers in the field of structural mechanics.
Autorenporträt
Shun-Qi Zhang, Dr.-Ing., is currently an associate professor at the School of Mechatronic Engineering and Automation (SMEA), Shanghai University, China. He obtained the doctoral degree with "outstanding" from RWTH Aachen University, Germany, and obtained the Master and Bachelor degrees from Northwestern Polytechnical University, China. His research interests include modeling of multi-physics coupled smart structures, active vibration control, nonlinear plate/shell theories, advanced mechatronic equipment and system dynamic testing.