Nonlinear Transistor Model Parameter Extraction Techniques
Herausgeber: Rudolph, Matthias; Root, David E; Fager, Christian
Nonlinear Transistor Model Parameter Extraction Techniques
Herausgeber: Rudolph, Matthias; Root, David E; Fager, Christian
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Achieve accurate and reliable parameter extraction using a broad range of techniques and models provided.
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Achieve accurate and reliable parameter extraction using a broad range of techniques and models provided.
Produktdetails
- Produktdetails
- Verlag: Cambridge University Press
- Seitenzahl: 366
- Erscheinungstermin: 5. Dezember 2011
- Englisch
- Abmessung: 249mm x 175mm x 23mm
- Gewicht: 862g
- ISBN-13: 9780521762106
- ISBN-10: 0521762103
- Artikelnr.: 33353621
- Verlag: Cambridge University Press
- Seitenzahl: 366
- Erscheinungstermin: 5. Dezember 2011
- Englisch
- Abmessung: 249mm x 175mm x 23mm
- Gewicht: 862g
- ISBN-13: 9780521762106
- ISBN-10: 0521762103
- Artikelnr.: 33353621
1. Introduction M. Rudolph; 2. DC and thermal modeling: III-V FETs and HBTs M. Iwamoto
J. Xu and D. E. Root; 3. Extrinsic parameter and parasitic elements in III-V HBT and HEMT modeling S. R. Nedeljkovic
W. J. Clausen
F. Kharabi
J. R. F. McMacken and J. M. Gering; 4. Uncertainties in small-signal equivalent circuit modeling C. Fager
K. Andersson and M. Ferndahl; 5. The large-signal model: theoretical foundations
practical considerations
and recent trends D. E. Root
J. Horn
J. Xu and M. Iwamoto; 6. Large and packaged transistors J. Engelmann
F.-J. Schmückle and M. Rudolph; 7. Characterization and modeling of dispersive effects O. Jardel
R. Sommet
J.-P. Teyssier and R. Quéré; 8. Optimizing microwave measurements for model construction and validation D. Schreurs
M. Myslinski and G. Crupi; 9. Practical statistical simulation for efficient circuit design P. Zampardi
Y. Yang
J. Hu
B. Li
M. Fredriksson
K. Kwok and H. Shao; 10. Noise modeling M. Berroth.
J. Xu and D. E. Root; 3. Extrinsic parameter and parasitic elements in III-V HBT and HEMT modeling S. R. Nedeljkovic
W. J. Clausen
F. Kharabi
J. R. F. McMacken and J. M. Gering; 4. Uncertainties in small-signal equivalent circuit modeling C. Fager
K. Andersson and M. Ferndahl; 5. The large-signal model: theoretical foundations
practical considerations
and recent trends D. E. Root
J. Horn
J. Xu and M. Iwamoto; 6. Large and packaged transistors J. Engelmann
F.-J. Schmückle and M. Rudolph; 7. Characterization and modeling of dispersive effects O. Jardel
R. Sommet
J.-P. Teyssier and R. Quéré; 8. Optimizing microwave measurements for model construction and validation D. Schreurs
M. Myslinski and G. Crupi; 9. Practical statistical simulation for efficient circuit design P. Zampardi
Y. Yang
J. Hu
B. Li
M. Fredriksson
K. Kwok and H. Shao; 10. Noise modeling M. Berroth.
1. Introduction M. Rudolph; 2. DC and thermal modeling: III-V FETs and HBTs M. Iwamoto
J. Xu and D. E. Root; 3. Extrinsic parameter and parasitic elements in III-V HBT and HEMT modeling S. R. Nedeljkovic
W. J. Clausen
F. Kharabi
J. R. F. McMacken and J. M. Gering; 4. Uncertainties in small-signal equivalent circuit modeling C. Fager
K. Andersson and M. Ferndahl; 5. The large-signal model: theoretical foundations
practical considerations
and recent trends D. E. Root
J. Horn
J. Xu and M. Iwamoto; 6. Large and packaged transistors J. Engelmann
F.-J. Schmückle and M. Rudolph; 7. Characterization and modeling of dispersive effects O. Jardel
R. Sommet
J.-P. Teyssier and R. Quéré; 8. Optimizing microwave measurements for model construction and validation D. Schreurs
M. Myslinski and G. Crupi; 9. Practical statistical simulation for efficient circuit design P. Zampardi
Y. Yang
J. Hu
B. Li
M. Fredriksson
K. Kwok and H. Shao; 10. Noise modeling M. Berroth.
J. Xu and D. E. Root; 3. Extrinsic parameter and parasitic elements in III-V HBT and HEMT modeling S. R. Nedeljkovic
W. J. Clausen
F. Kharabi
J. R. F. McMacken and J. M. Gering; 4. Uncertainties in small-signal equivalent circuit modeling C. Fager
K. Andersson and M. Ferndahl; 5. The large-signal model: theoretical foundations
practical considerations
and recent trends D. E. Root
J. Horn
J. Xu and M. Iwamoto; 6. Large and packaged transistors J. Engelmann
F.-J. Schmückle and M. Rudolph; 7. Characterization and modeling of dispersive effects O. Jardel
R. Sommet
J.-P. Teyssier and R. Quéré; 8. Optimizing microwave measurements for model construction and validation D. Schreurs
M. Myslinski and G. Crupi; 9. Practical statistical simulation for efficient circuit design P. Zampardi
Y. Yang
J. Hu
B. Li
M. Fredriksson
K. Kwok and H. Shao; 10. Noise modeling M. Berroth.