46,99 €
inkl. MwSt.
Versandkostenfrei*
Versandfertig in 1-2 Wochen
  • Broschiertes Buch

Chapter 1 Defines the general scattering problem, the SEM model, and the recognition methodology. ¿¿ Chapter ¿2 Covers the theoretical background on polarization concepts in narrow-band frequency measurements. Chapter ¿3 Covers the topics of broad frequency scattering and the novel estimation of the optimum polarization states. Chapter ¿4 Introduces another novel application based on a modified CPS set. Chapter ¿5 describes the extension of polarization scattering into the temporal domain and tackles the issue of estimating the optimum states based on temporal polarization data via the SEM.…mehr

Produktbeschreibung
Chapter 1 Defines the general scattering problem, the SEM model, and the recognition methodology. ¿¿ Chapter ¿2 Covers the theoretical background on polarization concepts in narrow-band frequency measurements. Chapter ¿3 Covers the topics of broad frequency scattering and the novel estimation of the optimum polarization states. Chapter ¿4 Introduces another novel application based on a modified CPS set. Chapter ¿5 describes the extension of polarization scattering into the temporal domain and tackles the issue of estimating the optimum states based on temporal polarization data via the SEM. Chapter ¿6 introduces a kernel estimator to model the variation with aspect angle for a resonant-polarization data. Chapter 7 covers two topics: The first topic of this chapter covers the concept of optimum bistatic scattering. The second topic will be on examining a signature pattern established by resonance energy as a function of polarization direction and aspect angles.
Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
Autorenporträt
Dr. Faisal F. H. Aldhubaib received both his B.E. degree in electrical and computer engineering and then his M.Sc. degree in radio and microwave engineering from the University of Leeds, UK, in 1995 and 1997, respectively. Then in 2010, he received his Ph.D. in Electromagnetic and Imaging Research.