Oxide Semiconductors: Volume 1633
Herausgeber: Durbin, Steve; Veal, Tim; Janotti, Anderson; Grundmann, Marius
Oxide Semiconductors: Volume 1633
Herausgeber: Durbin, Steve; Veal, Tim; Janotti, Anderson; Grundmann, Marius
- Gebundenes Buch
- Merkliste
- Auf die Merkliste
- Bewerten Bewerten
- Teilen
- Produkt teilen
- Produkterinnerung
- Produkterinnerung
Symposium R, 'Oxide Semiconductors' was held December 1-6 at the 2013 MRS Fall Meeting in Boston, Massachusetts.
Andere Kunden interessierten sich auch für
- Kousuke IhokuraThe Stannic Oxide Gas SensorPrinciples and Applications200,99 €
- Nanocomposites, Nanostructures and Heterostructures of Correlated Oxide Systems: Volume 145499,99 €
- Nanostructured Semiconductors and Nanotechnology: Volume 155186,99 €
- Zinc Oxide Nanostructures184,99 €
- Iron Oxide Nanoparticles135,99 €
- Zinc Oxide Materials for Electronic and Optoelectronic Device Applications282,99 €
- Photovoltaic Technologies, Devices and Systems Based on Inorganic Materials, Small Organic Molecules and Hybrids: Volume 149372,99 €
-
-
-
Symposium R, 'Oxide Semiconductors' was held December 1-6 at the 2013 MRS Fall Meeting in Boston, Massachusetts.
Produktdetails
- Produktdetails
- Verlag: Cambridge University Press
- Seitenzahl: 158
- Erscheinungstermin: 14. Juli 2014
- Englisch
- Abmessung: 231mm x 155mm x 15mm
- Gewicht: 386g
- ISBN-13: 9781605116105
- ISBN-10: 1605116106
- Artikelnr.: 41253344
- Verlag: Cambridge University Press
- Seitenzahl: 158
- Erscheinungstermin: 14. Juli 2014
- Englisch
- Abmessung: 231mm x 155mm x 15mm
- Gewicht: 386g
- ISBN-13: 9781605116105
- ISBN-10: 1605116106
- Artikelnr.: 41253344
Part I. Synthesis: 1. Synthesis and characterization of copper oxide
compounds; 2. Characterization of tin oxide grown by molecular beam
epitaxy; 3. Epitaxial growth of (Na,K)NbO3 based materials on SrTiO3 by
pulsed laser deposition; 4. Structural and electrical properties of LaNiO3
thin films grown on (100) and (001) oriented SrLaAlO4 substrates by
chemical solution deposition method; Part II. Optical and Electrical
Characterization: 5. Native point defects in multicomponent transparent
conducting oxides; 6. Electronic transport characterization of BiVO4 using
AC Field Hall Technique; 7. A DLTS study of a ZnO microwire, a thin film
and bulk material; 8. Evaluation of sub-gap states in amorphous In-Ga-Zn-O
thin films treated with various process conditions; 9. Effects of N2O
addition on the properties of ZnO thin films grown using high-temperature
H2O generated by catalytic reaction; 10. Density functional study of
benzoic acid derivatives modified SnO2 (110) surface; 11. Defect driven
emission from ZnO nano rods synthesized by fast microwave irradiation
method for optoelectronic applications; 12. Breaking of raman selection
rules in Cu2O by intrinsic point defects; 13. Characterization of
mechanical, optical and structural properties of bismuth oxide thin films
as a write-once medium for blue laser recording; Part III. Device Issues:
14. High performance IGZO TFTs with modified etch stop structure on glass
substrates; 15. Amorphous zinc-tin oxide thin films fabricated by pulsed
laser deposition at room temperature; 16. Solution processed resistive
random access memory devices for transparent solid-state circuit systems;
17. Structural and electrical characteristics of ternary oxide SmGdO3 for
logic and memory devices; 18. Correlation of resistance switching behaviors
with dielectric functions of manganite films: a study by spectroscopic
ellipsometry; 19. A continuous composition spread approach towards
monolithic, wavelength-selective multichannel UV-photo-detector arrays; 20.
Metal-semiconductor-insulator-metal structure field-effect transistors
based on zinc oxides and doped ferroelectric thin films; 21. Highly
reliable passivation layer for a-InGaZnO thin-film transistors fabricated
using polysilsesquioxane.
compounds; 2. Characterization of tin oxide grown by molecular beam
epitaxy; 3. Epitaxial growth of (Na,K)NbO3 based materials on SrTiO3 by
pulsed laser deposition; 4. Structural and electrical properties of LaNiO3
thin films grown on (100) and (001) oriented SrLaAlO4 substrates by
chemical solution deposition method; Part II. Optical and Electrical
Characterization: 5. Native point defects in multicomponent transparent
conducting oxides; 6. Electronic transport characterization of BiVO4 using
AC Field Hall Technique; 7. A DLTS study of a ZnO microwire, a thin film
and bulk material; 8. Evaluation of sub-gap states in amorphous In-Ga-Zn-O
thin films treated with various process conditions; 9. Effects of N2O
addition on the properties of ZnO thin films grown using high-temperature
H2O generated by catalytic reaction; 10. Density functional study of
benzoic acid derivatives modified SnO2 (110) surface; 11. Defect driven
emission from ZnO nano rods synthesized by fast microwave irradiation
method for optoelectronic applications; 12. Breaking of raman selection
rules in Cu2O by intrinsic point defects; 13. Characterization of
mechanical, optical and structural properties of bismuth oxide thin films
as a write-once medium for blue laser recording; Part III. Device Issues:
14. High performance IGZO TFTs with modified etch stop structure on glass
substrates; 15. Amorphous zinc-tin oxide thin films fabricated by pulsed
laser deposition at room temperature; 16. Solution processed resistive
random access memory devices for transparent solid-state circuit systems;
17. Structural and electrical characteristics of ternary oxide SmGdO3 for
logic and memory devices; 18. Correlation of resistance switching behaviors
with dielectric functions of manganite films: a study by spectroscopic
ellipsometry; 19. A continuous composition spread approach towards
monolithic, wavelength-selective multichannel UV-photo-detector arrays; 20.
Metal-semiconductor-insulator-metal structure field-effect transistors
based on zinc oxides and doped ferroelectric thin films; 21. Highly
reliable passivation layer for a-InGaZnO thin-film transistors fabricated
using polysilsesquioxane.
Part I. Synthesis: 1. Synthesis and characterization of copper oxide
compounds; 2. Characterization of tin oxide grown by molecular beam
epitaxy; 3. Epitaxial growth of (Na,K)NbO3 based materials on SrTiO3 by
pulsed laser deposition; 4. Structural and electrical properties of LaNiO3
thin films grown on (100) and (001) oriented SrLaAlO4 substrates by
chemical solution deposition method; Part II. Optical and Electrical
Characterization: 5. Native point defects in multicomponent transparent
conducting oxides; 6. Electronic transport characterization of BiVO4 using
AC Field Hall Technique; 7. A DLTS study of a ZnO microwire, a thin film
and bulk material; 8. Evaluation of sub-gap states in amorphous In-Ga-Zn-O
thin films treated with various process conditions; 9. Effects of N2O
addition on the properties of ZnO thin films grown using high-temperature
H2O generated by catalytic reaction; 10. Density functional study of
benzoic acid derivatives modified SnO2 (110) surface; 11. Defect driven
emission from ZnO nano rods synthesized by fast microwave irradiation
method for optoelectronic applications; 12. Breaking of raman selection
rules in Cu2O by intrinsic point defects; 13. Characterization of
mechanical, optical and structural properties of bismuth oxide thin films
as a write-once medium for blue laser recording; Part III. Device Issues:
14. High performance IGZO TFTs with modified etch stop structure on glass
substrates; 15. Amorphous zinc-tin oxide thin films fabricated by pulsed
laser deposition at room temperature; 16. Solution processed resistive
random access memory devices for transparent solid-state circuit systems;
17. Structural and electrical characteristics of ternary oxide SmGdO3 for
logic and memory devices; 18. Correlation of resistance switching behaviors
with dielectric functions of manganite films: a study by spectroscopic
ellipsometry; 19. A continuous composition spread approach towards
monolithic, wavelength-selective multichannel UV-photo-detector arrays; 20.
Metal-semiconductor-insulator-metal structure field-effect transistors
based on zinc oxides and doped ferroelectric thin films; 21. Highly
reliable passivation layer for a-InGaZnO thin-film transistors fabricated
using polysilsesquioxane.
compounds; 2. Characterization of tin oxide grown by molecular beam
epitaxy; 3. Epitaxial growth of (Na,K)NbO3 based materials on SrTiO3 by
pulsed laser deposition; 4. Structural and electrical properties of LaNiO3
thin films grown on (100) and (001) oriented SrLaAlO4 substrates by
chemical solution deposition method; Part II. Optical and Electrical
Characterization: 5. Native point defects in multicomponent transparent
conducting oxides; 6. Electronic transport characterization of BiVO4 using
AC Field Hall Technique; 7. A DLTS study of a ZnO microwire, a thin film
and bulk material; 8. Evaluation of sub-gap states in amorphous In-Ga-Zn-O
thin films treated with various process conditions; 9. Effects of N2O
addition on the properties of ZnO thin films grown using high-temperature
H2O generated by catalytic reaction; 10. Density functional study of
benzoic acid derivatives modified SnO2 (110) surface; 11. Defect driven
emission from ZnO nano rods synthesized by fast microwave irradiation
method for optoelectronic applications; 12. Breaking of raman selection
rules in Cu2O by intrinsic point defects; 13. Characterization of
mechanical, optical and structural properties of bismuth oxide thin films
as a write-once medium for blue laser recording; Part III. Device Issues:
14. High performance IGZO TFTs with modified etch stop structure on glass
substrates; 15. Amorphous zinc-tin oxide thin films fabricated by pulsed
laser deposition at room temperature; 16. Solution processed resistive
random access memory devices for transparent solid-state circuit systems;
17. Structural and electrical characteristics of ternary oxide SmGdO3 for
logic and memory devices; 18. Correlation of resistance switching behaviors
with dielectric functions of manganite films: a study by spectroscopic
ellipsometry; 19. A continuous composition spread approach towards
monolithic, wavelength-selective multichannel UV-photo-detector arrays; 20.
Metal-semiconductor-insulator-metal structure field-effect transistors
based on zinc oxides and doped ferroelectric thin films; 21. Highly
reliable passivation layer for a-InGaZnO thin-film transistors fabricated
using polysilsesquioxane.