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Parallel Inverse Halftoning via Look-Up Table (LUT) Partitioning - Sait, Sadiq M.
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  • Broschiertes Buch

The Look-Up Table (LUT) method for inverse halftoning is fast and computation-free technique employed to obtain good quality images. In this book we propose six algorithms to parallelize the LUT method so that more pixels can be concurrently inverse halftone using minimum additional hardware. The proposed algorithms partition the single LUT of serial LUT method into N smaller Look-Up Tables (s- LUTs) such that the total number of contents in all s-LUTs remain equal to the number of contents in the single LUT of serial LUT method. The proposed parallel algorithms have image quality equal to the…mehr

Produktbeschreibung
The Look-Up Table (LUT) method for inverse
halftoning is fast and computation-free technique
employed to obtain good quality images. In this book
we propose six algorithms to parallelize the LUT
method so that more pixels can be concurrently
inverse halftone using minimum additional hardware.
The proposed algorithms partition the single LUT of
serial LUT method into N smaller Look-Up Tables (s-
LUTs) such that the total number of contents in all
s-LUTs remain equal to the number of contents in the
single LUT of serial LUT method. The proposed
parallel algorithms have image quality equal to the
serial LUT method when gain in clock cycles over the
serial method is less and have lesser image quality
comparetively to serial LUT method when gain in
clock cycles over the serial method is very high.
The parallel algorithms can be implemented on FPGA
(Field Programmable Gate Arrays) devices with
external CAM (Content Addressable Memories) and ROM
(Read Only Memories)
Autorenporträt
Sadiq M. Sait:(BS'81,MS'83,PhD'87) is a Professor of Computer
Engineering at KFUPM, Dhahran. He has authored over 100 research
papers in Intl Journals & Conferences and several books on VLSI
Design Automation and Iterative Algorithms. Umair F. Siddiqi:
(BE'02,MS'07) is Applications Developer at KFUPM. He has 4
papers in Intl Journals & Confs.