Main description:
A classic -- offering comprehensive and unified coverage with a balance between theory and practice!
Pattern recognition is integral to a wide spectrum of scientific disciplines and technologies including image analysis, speech recognition, audio classification, communications, computer-aided diagnosis, and data mining. The authors, leading experts in the field of pattern recognition, have once again provided an up-to-date, self-contained volume encapsulating this wide spectrum of information.
Each chapter is designed to begin with basics of theory progressing to advanced topics and then discusses cutting-edge techniques. Problems and exercises are present at the end of each chapter with a solutions manual provided via a companion website where a number of demonstrations are also available to aid the reader in gaining practical experience with the theories and associated algorithms.
This edition includes discussion of Bayesian classification, Bayesian networks, linear and nonlinear classifier design (including neural networks and support vector machines), dynamic programming and hidden Markov models for sequential data, feature generation (including wavelets, principal component analysis, independent component analysis and fractals), feature selection techniques, basic concepts from learning theory, and clustering concepts and algorithms. This book considers classical and current theory and practice, of both supervised and unsupervised pattern recognition, to build a complete background for professionals and students of engineering.
FOR INSTRUCTORS: To obtain access to the solutions manual for this title simply register on our textbook website (textbooks.elsevier.com)and request access to the Computer Science or Electronics and Electrical Engineering subject area. Once approved (usually within one business day) you will be able to access all of the instructor-only materials through the "Instructor Manual" link on this book's full web page.
- The latest results on support vector machines including v-SVMs and their geometric interpretation
- Classifier combinations including the Boosting approach
- State-of-the-art material for clustering algorithms tailored for large data sets and/or high dimensional data, as required by applications such as web-mining and bioinformatics
- Coverage of diverse applications such as image analysis, optical character recognition, channel equalization, speech recognition and audio classification
Review quote:
"The book is written in a very readable, no-nonsense style. I found that there was just the right amount of text to describe a concept, without extraneous verbiage. The same is true for the mathematics, enough for description, not too much to overwhelm."
Larry O'Gorman, IAPR Newsletter, April 2006
Table of contents:
Chapter 1: Introduction
Chapter 2: Classifiers Based on Bayes Decision Theory
Chapter 3: Linear Classifiers
Chapter 4: Nonlinear Classifiers
Chapter 5: Feature Selection
Chapter 6: Feature Generation I
Chapter 7: Feature Generation II
Chapter 8: Template Matching
Chapter 9: Context-Dependant Classification
Chapter 10: System Evaluation
Chapter 11: Clustering: Basic Concepts
Chapter 12: Clustering Algorithms I (Sequential)
Chapter 13: Clustering Algorithms II (Hierarchical)
Chapter 14: Clustering Algorithms III (Functional Optimization)
Chapter 15: Clustering Algorithms IV (Graph Theory)
Chapter 16: Cluster Validity
A classic -- offering comprehensive and unified coverage with a balance between theory and practice!
Pattern recognition is integral to a wide spectrum of scientific disciplines and technologies including image analysis, speech recognition, audio classification, communications, computer-aided diagnosis, and data mining. The authors, leading experts in the field of pattern recognition, have once again provided an up-to-date, self-contained volume encapsulating this wide spectrum of information.
Each chapter is designed to begin with basics of theory progressing to advanced topics and then discusses cutting-edge techniques. Problems and exercises are present at the end of each chapter with a solutions manual provided via a companion website where a number of demonstrations are also available to aid the reader in gaining practical experience with the theories and associated algorithms.
This edition includes discussion of Bayesian classification, Bayesian networks, linear and nonlinear classifier design (including neural networks and support vector machines), dynamic programming and hidden Markov models for sequential data, feature generation (including wavelets, principal component analysis, independent component analysis and fractals), feature selection techniques, basic concepts from learning theory, and clustering concepts and algorithms. This book considers classical and current theory and practice, of both supervised and unsupervised pattern recognition, to build a complete background for professionals and students of engineering.
FOR INSTRUCTORS: To obtain access to the solutions manual for this title simply register on our textbook website (textbooks.elsevier.com)and request access to the Computer Science or Electronics and Electrical Engineering subject area. Once approved (usually within one business day) you will be able to access all of the instructor-only materials through the "Instructor Manual" link on this book's full web page.
- The latest results on support vector machines including v-SVMs and their geometric interpretation
- Classifier combinations including the Boosting approach
- State-of-the-art material for clustering algorithms tailored for large data sets and/or high dimensional data, as required by applications such as web-mining and bioinformatics
- Coverage of diverse applications such as image analysis, optical character recognition, channel equalization, speech recognition and audio classification
Review quote:
"The book is written in a very readable, no-nonsense style. I found that there was just the right amount of text to describe a concept, without extraneous verbiage. The same is true for the mathematics, enough for description, not too much to overwhelm."
Larry O'Gorman, IAPR Newsletter, April 2006
Table of contents:
Chapter 1: Introduction
Chapter 2: Classifiers Based on Bayes Decision Theory
Chapter 3: Linear Classifiers
Chapter 4: Nonlinear Classifiers
Chapter 5: Feature Selection
Chapter 6: Feature Generation I
Chapter 7: Feature Generation II
Chapter 8: Template Matching
Chapter 9: Context-Dependant Classification
Chapter 10: System Evaluation
Chapter 11: Clustering: Basic Concepts
Chapter 12: Clustering Algorithms I (Sequential)
Chapter 13: Clustering Algorithms II (Hierarchical)
Chapter 14: Clustering Algorithms III (Functional Optimization)
Chapter 15: Clustering Algorithms IV (Graph Theory)
Chapter 16: Cluster Validity