Robert Thomas (Scientific Solutions, Gaithersburg, Maryland, USA)
Practical Guide to ICP-MS and Other Atomic Spectroscopy Techniques
A Tutorial for Beginners
Robert Thomas (Scientific Solutions, Gaithersburg, Maryland, USA)
Practical Guide to ICP-MS and Other Atomic Spectroscopy Techniques
A Tutorial for Beginners
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Written by one of the very first practitioners of ICP-MS, a Practical Guide to ICP-MS and Other AS Techniques: A Tutorial for Beginners presents ICP-MS in a completely novel and refreshing way
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Written by one of the very first practitioners of ICP-MS, a Practical Guide to ICP-MS and Other AS Techniques: A Tutorial for Beginners presents ICP-MS in a completely novel and refreshing way
Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
Produktdetails
- Produktdetails
- Practical Spectroscopy
- Verlag: Taylor & Francis Ltd
- 4 ed
- Seitenzahl: 462
- Erscheinungstermin: 29. September 2023
- Englisch
- Abmessung: 260mm x 183mm x 29mm
- Gewicht: 1096g
- ISBN-13: 9781032035024
- ISBN-10: 1032035021
- Artikelnr.: 67825279
- Herstellerkennzeichnung
- Books on Demand GmbH
- In de Tarpen 42
- 22848 Norderstedt
- info@bod.de
- 040 53433511
- Practical Spectroscopy
- Verlag: Taylor & Francis Ltd
- 4 ed
- Seitenzahl: 462
- Erscheinungstermin: 29. September 2023
- Englisch
- Abmessung: 260mm x 183mm x 29mm
- Gewicht: 1096g
- ISBN-13: 9781032035024
- ISBN-10: 1032035021
- Artikelnr.: 67825279
- Herstellerkennzeichnung
- Books on Demand GmbH
- In de Tarpen 42
- 22848 Norderstedt
- info@bod.de
- 040 53433511
Robert (Rob) Thomas is the Principal Scientist at Scientific Solutions, a consulting company that serves the educational needs of the trace element analysis user community. He has worked in the field of atomic and mass spectroscopy for almost 50 years, including 24 years for a manufacturer of atomic spectroscopic instrumentation. He has served on the American Chemical Society (ACS) Committee on Analytical Reagents (CAR) for the past 20 years as leader of the plasma spectrochemistry, heavy metals task force, where he has worked very closely with the United States Pharmacopeia (USP) to align ACS heavy metal testing procedures with pharmaceutical guidelines. Rob has written over 100 technical publications, including a 15-part tutorial series on ICP-MS. He is also the editor of and frequent contributor to the Atomic Perspectives column in Spectroscopy magazine, as well as serving on the editorial advisory board of Analytical Cannabis. In addition, Rob has authored five textbooks on the fundamental principles and applications of ICP-MS. Prior to this new edition of Practical Guide to ICP-MS and Other Atomic Spectroscopy Techniques, his most recent book was a paperback version of Measuring Heavy Metal Contaminants in Cannabis and Hemp, published in December 2021. Rob has an advanced degree in analytical chemistry from the University of Wales, UK, and is also a fellow of the Royal Society of Chemistry (FRSC) and a Chartered Chemist (CChem).
Contents
Foreword
Preface
Acknowledgements
Author Bio
Chapter 1: An Overview of ICP Mass Spectrometry
Chapter 2: Principles of Ion Formation
Chapter 3: Sample Introduction
Chapter 4: Plasma Source
Chapter 5: Interface Region
Chapter 6: Ion Focusing System
Chapter 7: Mass Analyzers: Quadrupole Technology
Chapter 8: Mass Analyzers: Double-Focusing Magnetic Sector Technology
Chapter 9: Mass Analyzers: Time-Of-Flight Technology
Chapter 10: Mass Analyzers: Collision/Reaction Cell and Interface
Technology
Chapter 11: Ion Detection
Chapter 12: Peak Measurement Protocol
Chapter 13: Methods of Quantitation
Chapter 14: Review of Interferences
Chapter 15: Routine Maintenance
Chapter 16: Sampling and Sample Preparation Procedures
Chapter 17: Reducing Errors from Contamination
Chapter 18: Alternative Sampling Accessories
Chapter 19: Trace Element Speciation Techniques
Chapter 20: The ICP-MS Application Landscape
Chapter 21: Fundamental Principles and Applications of Atomic
Absorption/Fluorescence
Chapter 22: Fundamental Principles and Applications of ICP Optical Emission
Spectrometry
Chapter 23: Fundamental Principles of Applications of Other Atomic
Spectroscopic Techniques
* X Ray Analytical Techniques (XRF/XRD)
* Microwave Induced Plasma Atomic Emission Spectrometry (MIP-AES)
* Laser Induced Breakdown Spectrometry (LIBS)
* Laser Ionization Laser Ablation Time-Of-Flight Mass Spectrometry
(LALI-TOF-MS)
Chapter 24: Comparing ICP-MS With Other Atomic Spectroscopy Techniques
Chapter 25: Cost of Analysis of AS Techniques
Chapter 26: How to Select an ICP-MS: Some Important Analytical
Considerations
Chapter 27: Glossary of Terms Used in Atomic Spectroscopy (AS)
Chapter 28: Useful Contact Information
Foreword
Preface
Acknowledgements
Author Bio
Chapter 1: An Overview of ICP Mass Spectrometry
Chapter 2: Principles of Ion Formation
Chapter 3: Sample Introduction
Chapter 4: Plasma Source
Chapter 5: Interface Region
Chapter 6: Ion Focusing System
Chapter 7: Mass Analyzers: Quadrupole Technology
Chapter 8: Mass Analyzers: Double-Focusing Magnetic Sector Technology
Chapter 9: Mass Analyzers: Time-Of-Flight Technology
Chapter 10: Mass Analyzers: Collision/Reaction Cell and Interface
Technology
Chapter 11: Ion Detection
Chapter 12: Peak Measurement Protocol
Chapter 13: Methods of Quantitation
Chapter 14: Review of Interferences
Chapter 15: Routine Maintenance
Chapter 16: Sampling and Sample Preparation Procedures
Chapter 17: Reducing Errors from Contamination
Chapter 18: Alternative Sampling Accessories
Chapter 19: Trace Element Speciation Techniques
Chapter 20: The ICP-MS Application Landscape
Chapter 21: Fundamental Principles and Applications of Atomic
Absorption/Fluorescence
Chapter 22: Fundamental Principles and Applications of ICP Optical Emission
Spectrometry
Chapter 23: Fundamental Principles of Applications of Other Atomic
Spectroscopic Techniques
* X Ray Analytical Techniques (XRF/XRD)
* Microwave Induced Plasma Atomic Emission Spectrometry (MIP-AES)
* Laser Induced Breakdown Spectrometry (LIBS)
* Laser Ionization Laser Ablation Time-Of-Flight Mass Spectrometry
(LALI-TOF-MS)
Chapter 24: Comparing ICP-MS With Other Atomic Spectroscopy Techniques
Chapter 25: Cost of Analysis of AS Techniques
Chapter 26: How to Select an ICP-MS: Some Important Analytical
Considerations
Chapter 27: Glossary of Terms Used in Atomic Spectroscopy (AS)
Chapter 28: Useful Contact Information
Contents
Foreword
Preface
Acknowledgements
Author Bio
Chapter 1: An Overview of ICP Mass Spectrometry
Chapter 2: Principles of Ion Formation
Chapter 3: Sample Introduction
Chapter 4: Plasma Source
Chapter 5: Interface Region
Chapter 6: Ion Focusing System
Chapter 7: Mass Analyzers: Quadrupole Technology
Chapter 8: Mass Analyzers: Double-Focusing Magnetic Sector Technology
Chapter 9: Mass Analyzers: Time-Of-Flight Technology
Chapter 10: Mass Analyzers: Collision/Reaction Cell and Interface
Technology
Chapter 11: Ion Detection
Chapter 12: Peak Measurement Protocol
Chapter 13: Methods of Quantitation
Chapter 14: Review of Interferences
Chapter 15: Routine Maintenance
Chapter 16: Sampling and Sample Preparation Procedures
Chapter 17: Reducing Errors from Contamination
Chapter 18: Alternative Sampling Accessories
Chapter 19: Trace Element Speciation Techniques
Chapter 20: The ICP-MS Application Landscape
Chapter 21: Fundamental Principles and Applications of Atomic
Absorption/Fluorescence
Chapter 22: Fundamental Principles and Applications of ICP Optical Emission
Spectrometry
Chapter 23: Fundamental Principles of Applications of Other Atomic
Spectroscopic Techniques
* X Ray Analytical Techniques (XRF/XRD)
* Microwave Induced Plasma Atomic Emission Spectrometry (MIP-AES)
* Laser Induced Breakdown Spectrometry (LIBS)
* Laser Ionization Laser Ablation Time-Of-Flight Mass Spectrometry
(LALI-TOF-MS)
Chapter 24: Comparing ICP-MS With Other Atomic Spectroscopy Techniques
Chapter 25: Cost of Analysis of AS Techniques
Chapter 26: How to Select an ICP-MS: Some Important Analytical
Considerations
Chapter 27: Glossary of Terms Used in Atomic Spectroscopy (AS)
Chapter 28: Useful Contact Information
Foreword
Preface
Acknowledgements
Author Bio
Chapter 1: An Overview of ICP Mass Spectrometry
Chapter 2: Principles of Ion Formation
Chapter 3: Sample Introduction
Chapter 4: Plasma Source
Chapter 5: Interface Region
Chapter 6: Ion Focusing System
Chapter 7: Mass Analyzers: Quadrupole Technology
Chapter 8: Mass Analyzers: Double-Focusing Magnetic Sector Technology
Chapter 9: Mass Analyzers: Time-Of-Flight Technology
Chapter 10: Mass Analyzers: Collision/Reaction Cell and Interface
Technology
Chapter 11: Ion Detection
Chapter 12: Peak Measurement Protocol
Chapter 13: Methods of Quantitation
Chapter 14: Review of Interferences
Chapter 15: Routine Maintenance
Chapter 16: Sampling and Sample Preparation Procedures
Chapter 17: Reducing Errors from Contamination
Chapter 18: Alternative Sampling Accessories
Chapter 19: Trace Element Speciation Techniques
Chapter 20: The ICP-MS Application Landscape
Chapter 21: Fundamental Principles and Applications of Atomic
Absorption/Fluorescence
Chapter 22: Fundamental Principles and Applications of ICP Optical Emission
Spectrometry
Chapter 23: Fundamental Principles of Applications of Other Atomic
Spectroscopic Techniques
* X Ray Analytical Techniques (XRF/XRD)
* Microwave Induced Plasma Atomic Emission Spectrometry (MIP-AES)
* Laser Induced Breakdown Spectrometry (LIBS)
* Laser Ionization Laser Ablation Time-Of-Flight Mass Spectrometry
(LALI-TOF-MS)
Chapter 24: Comparing ICP-MS With Other Atomic Spectroscopy Techniques
Chapter 25: Cost of Analysis of AS Techniques
Chapter 26: How to Select an ICP-MS: Some Important Analytical
Considerations
Chapter 27: Glossary of Terms Used in Atomic Spectroscopy (AS)
Chapter 28: Useful Contact Information