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This work is about the polarization properties of image sensors and the effect of their spatial position in the optical scheme on the measurement error. The following theoretical issues of the polarization sensitivity of image sensors are considered: the effect of the materials transmission and the refraction of light on the interfaces constituting the pixel structure; the orientation of the sensor relative to the incident linearly polarized light. There are shown the methods for calculating the polarization sensitivity and algorithms simulating different illumination conditions. This method…mehr

Produktbeschreibung
This work is about the polarization properties of image sensors and the effect of their spatial position in the optical scheme on the measurement error. The following theoretical issues of the polarization sensitivity of image sensors are considered: the effect of the materials transmission and the refraction of light on the interfaces constituting the pixel structure; the orientation of the sensor relative to the incident linearly polarized light. There are shown the methods for calculating the polarization sensitivity and algorithms simulating different illumination conditions. This method can be used for metrological attestation of CCDs or CMOS sensors in terms of polarization sensitivity, and also to take into account the influence of the sensor's structure on the measurement results. This will increase the accuracy of measurements in polarized light.
Autorenporträt
Vasileva Anna, researcher of polarization optics, engineer in ITMO University, Department of optical-electronic devices and systems, Saint-Petersburg, Russian Federation.