Peter W Hawkes, Erwin Kasper

Principles of Electron Optics, Volume 1

Basic Geometrical Optics

• Broschiertes Buch

Produktbeschreibung

Volume one of Principles of Electron Optics: Basic Geometrical Optics, Second Edition, explores the geometrical optics needed to analyze an extremely wide range of instruments: cathode-ray tubes; the family of electron microscopes, including the fixed-beam and scanning transmission instruments, the scanning electron microscope and the emission microscope; electron spectrometers and mass spectrograph; image converters; electron interferometers and diffraction devices; electron welding machines; and electron-beam lithography devices. The book provides a self-contained, detailed, modern account of electron optics for anyone involved with particle beams of modest current density in the energy range up to a few mega-electronvolts. You will find all the basic equations with their derivations, recent ideas concerning aberration studies, extensive discussion of the numerical methods needed to calculate the properties of specific systems and guidance to the literature of all the topics covered. A continuation of these topics can be found in volume two, Principles of Electron Optics: Applied Geometrical Optics. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography.

Produktdetails

• Verlag: Elsevier Health Sciences
• 2nd edition
• Seitenzahl: 728
• Erscheinungstermin: 29. Oktober 2017
• Englisch
• Abmessung: 238mm x 192mm x 42mm
• Gewicht: 1464g
• ISBN-13: 9780081022566
• ISBN-10: 0081022565
• Artikelnr.: 47829340

Autorenporträt

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Inhaltsangabe

1. Introduction
PART I - CLASSICAL MECHANICS 2. Relativistic Kinematics 3. Different Forms
of Trajectory Equations 4. Variational Principles 5. Hamiltonian Optics
PART II - CALCULATION OF STATIC FIELDS 6. Basic Concepts and Equations 7.
Series Expansions 8. Boundary-Value Problems 9. Integral Equations 10. The
Boundary-Element Method 11. The Finite-Difference Method (FDM) 12. The
Finite-Element Method (FEM) 13. Field-Interpolation Techniques
PART III - THE PARAXIAL APPROXIMATION 14. Introduction 15. Systems with an
Axis of Rotational Symmetry 16. Gaussian Optics of Rotationally Symmetric
Systems: Asymptotic Image Formation 17. Gaussian Optics of Rotationally
Symmetric Systems: Real Cardinal Elements 18. Electron Mirrors 19.
Quadrupole Lenses 20. Cylindrical Lenses
PART IV - ABERRATIONS 21. Introduction 22. Perturbation Theory: General
Formalism 23. The Relation Between Permitted Types of Aberration and System
Symmetry 24. The Geometrical Aberrations of Round Lenses 25. Asymptotic
Aberration Coefficients 26. Chromatic Aberrations 27. Aberration Matrices
and the Aberrations of Lens Combinations 28. The Aberrations of Mirrors and
Cathode Lenses 29. The Aberrations of Quadrupole Lenses and Octopoles 30.
The Aberrations of Cylindrical Lenses 31. Parasitic Aberrations
PART V - DEFLECTION SYSTEMS 32. Paraxial Properties of Deflection Systems
33. The Aberrations of Deflection Systems
PART VI - COMPUTER-AIDED ELECTRON OPTICS 34. Numerical Calculation of
Trajectories, Paraxial Properties and Aberrations