Principles of Materials Characterization and Metrology - Krishnan, Kannan M
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This book provides a comprehensive introduction to the principles of materials characterization and metrology. Based on several decades of teaching experience, it includes many worked examples, questions and exercises, suitable for students at the undergraduate or beginning graduate level.

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Produktbeschreibung
This book provides a comprehensive introduction to the principles of materials characterization and metrology. Based on several decades of teaching experience, it includes many worked examples, questions and exercises, suitable for students at the undergraduate or beginning graduate level.
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Autorenporträt
Kannan M. Krishnan graduated from the Indian Institute of Technology, Kanpur and earned his Ph.D. from University of California, Berkeley (UCB) in 1984. He is currently Professor of Materials Sciences and Physics at the University of Washington (UW). He is a Fellow of the American Physical Society, the Institute of Physics (London), the American Association for the Advancement of Science, and the Institute of Electrical and Electronics Engineers (IEEE). He has received the Burton Medal (MSA), the Fink Prize (IEEE), the Guggenheim and Rockefeller fellowships, a Fulbright Specialist award, the Distinguished Engineer/Scientist award (TMS) and the Alexander von Humboldt Research Award, and has been elected a member of the Washington State Academy of Sciences. With visiting appointments at institutions in all six continents and multiple teaching awards at UCB, UW and professional societies (IEEE Magnetics Distinguished Lectureship), he is widely recognized for his role in education.