Production Testing of RF and System-on-a-Chip Devices for Wireless Communications - Schaub, Keith B
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Technological advances have created a need for the merger and rethinking of past testing approaches for wireless equipment. This first-of-its-kind resource offers professionals an in-depth overview of cutting-edge RF (radio frequency) and SOC (system on a chip) product testing for wireless communications.

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Produktbeschreibung
Technological advances have created a need for the merger and rethinking of past testing approaches for wireless equipment. This first-of-its-kind resource offers professionals an in-depth overview of cutting-edge RF (radio frequency) and SOC (system on a chip) product testing for wireless communications.
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Autorenporträt
Keith B. Schaub is a Wireless Center of Expertise Senior RF technical consultant at Agilent Technologies. Mr. Schaub has over 10 years of professional engineering experience and received his M.S. in Electrical Engineering from the University of Texas. Joe Kelly is a Wireless Center of Expertise RF technical consultant at Agilent Technologies. Dr. Kelly earned his Ph.D. and M.S. in Ceramic and Materials Engineering at Rutgers University. He is a frequent presenter at international conferences and workshops.