Xiao-Feng Zhang / Ze Zhang (eds.)

Progress in Transmission Electron Microscopy 1 / Progress in Transmission Electron Microscopy Vol.1

Mitarbeit: Zhang, Xiao-Feng; Zhang, Ze, Herausgegeben:Zhang, Xiao-Feng; Zhang, Ze

• Gebundenes Buch

Produktbeschreibung

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.

Produktdetails

• Springer Series in Surface Sciences 38
• Verlag: Springer / Springer Berlin Heidelberg / Springer, Berlin
• Artikelnr. des Verlages: 978-3-540-67680-5
• Seitenzahl: 367
• Englisch
• Abmessung: 239mm x 157mm x 27mm
• Gewicht: 698g
• ISBN-13: 9783540676805
• ISBN-10: 3540676805
• Artikelnr.: 09276751

Inhaltsangabe

1 The Modern Microscope Today.- 2 The Quest for Ultra-High Resolution.- 3 Z-Contrast Imaging in the Scanning Transmission Electron Microscope.- 4 Inelastic Scattering in Electron Microscopy-Effects, Spectrometry and Imaging.- 5 Quantitative Analysis of High-Resolution Atomic Images.- 6 Electron Crystallography-Structure determination by combining HREM, Crystallographic image processing and electron diffraction.- 7 Electron Amorphography.- 8 Weak-Beam Electron Microscopy.- 9 Point Group and Space Group Identification by Convergent Beam Electron Diffraction.- 10 Advanced Techniques in TEM Specimen Preparation.