There is a need to understand and combat potential radiation damage problems in semiconductor devices and circuits. This book explains the effects of radiation on semiconductor devices, radiation detectors, and electronic devices and components. It explores the applications, detector technologies, and circuit design techniques.
There is a need to understand and combat potential radiation damage problems in semiconductor devices and circuits. This book explains the effects of radiation on semiconductor devices, radiation detectors, and electronic devices and components. It explores the applications, detector technologies, and circuit design techniques.Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
Krzysztof (Kris) Iniewski is managing R&D chip development activities at Redlen Technologies Inc., a start-up company in British Columbia. His research interests are in VLSI circuits for medical and security applications. From 2004 to 2006 he was an Associate Professor at the Electrical Engineering and Computer Engineering Department of University of Alberta where he conducted research on low-power wireless circuits and systems. During his tenure in Edmonton he wrote "Wireless Technologies: Circuits, Systems and Devices" (CRC Press). From 1995 to 2003, he was with PMC-Sierra and held various technical and management positions. Prior to joining PMC-Sierra, from 1990 to 1994 he was an Assistant Professor at the University of Toronto's Electrical Engineering and Computer Engineering. Dr. Iniewski has published more than 100 research papers in international journals and conferences. He holds 18 international patents granted in USA, Canada, France, Germany, and Japan. He received his Ph.D. degree in electronics (honors) from the Warsaw University of Technology (Warsaw, Poland) in 1988.
Inhaltsangabe
Section I: Devices Radiation Damage in Silicon. Radiation-Tolerant CMOS Single-Photon Imagers for Multiradiation Detection Effects of Hydrogen on the Radiation Response of Field-Oxide. Field-Effect Transistors and High-K Dielectrics. Novel Total Dose and Heavy-Ion Charge Collection Phenomena in a New SiGe HBT on Thin-Film SOI Technology. Radiation-Hard Voltage and Current References in Standard CMOS Technologies. Nanocrystal Memories: An Evolutionary Approach to Flash Memory Scaling and a Class of Radiation-Tolerant Devices. Section II: Circuits and Systems Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation. A Complete Guide to Multiple Upsets in SRAMs Processed in Decananometric CMOS Technologies. Real-Time Soft Error Rate Characterization of Advanced SRAMs. Fault Tolerance Techniques and Reliability Modeling for SRAM-Based FPGAs Assuring Robust Triple Modular Redundancy Protected Circuits in SRAM-Based FPGAs. SEU/SET Tolerant Phase-Locked Loops. Autonomous Detection and Characterization of Radiation-Induced Transients in Semiconductor Integrated Circuits. Soft Errors in Digital Circuits: Overview and Protection Techniques for Digital Filters. Fault-Injection Techniques for Dependability Analysis: An Overview. Index.
Section I: Devices Radiation Damage in Silicon. Radiation-Tolerant CMOS Single-Photon Imagers for Multiradiation Detection Effects of Hydrogen on the Radiation Response of Field-Oxide. Field-Effect Transistors and High-K Dielectrics. Novel Total Dose and Heavy-Ion Charge Collection Phenomena in a New SiGe HBT on Thin-Film SOI Technology. Radiation-Hard Voltage and Current References in Standard CMOS Technologies. Nanocrystal Memories: An Evolutionary Approach to Flash Memory Scaling and a Class of Radiation-Tolerant Devices. Section II: Circuits and Systems Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation. A Complete Guide to Multiple Upsets in SRAMs Processed in Decananometric CMOS Technologies. Real-Time Soft Error Rate Characterization of Advanced SRAMs. Fault Tolerance Techniques and Reliability Modeling for SRAM-Based FPGAs Assuring Robust Triple Modular Redundancy Protected Circuits in SRAM-Based FPGAs. SEU/SET Tolerant Phase-Locked Loops. Autonomous Detection and Characterization of Radiation-Induced Transients in Semiconductor Integrated Circuits. Soft Errors in Digital Circuits: Overview and Protection Techniques for Digital Filters. Fault-Injection Techniques for Dependability Analysis: An Overview. Index.
Es gelten unsere Allgemeinen Geschäftsbedingungen: www.buecher.de/agb
Impressum
www.buecher.de ist ein Internetauftritt der buecher.de internetstores GmbH
Geschäftsführung: Monica Sawhney | Roland Kölbl | Günter Hilger
Sitz der Gesellschaft: Batheyer Straße 115 - 117, 58099 Hagen
Postanschrift: Bürgermeister-Wegele-Str. 12, 86167 Augsburg
Amtsgericht Hagen HRB 13257
Steuernummer: 321/5800/1497
USt-IdNr: DE450055826
