Zhong Lin Wang, Wang Zhong Lin

Reflection Electron Microscopy and Spectroscopy for Surface Analysis

• Broschiertes Buch

Produktdetails

• Verlag: Cambridge University Press
• Seitenzahl: 460
• Erscheinungstermin: 31. Mai 2005
• Englisch
• Abmessung: 244mm x 170mm x 25mm
• Gewicht: 788g
• ISBN-13: 9780521017954
• ISBN-10: 0521017955
• Artikelnr.: 22117806

Inhaltsangabe

1. Kinematical electron diffraction
Part I. Diffraction of Reflected Electrons: 2. Reflection high-energy electron diffraction
3. Dynamical theories of RHEED
4. Resonance reflections in RHEED
Part II. Imaging of Reflected Electrons: 5. Imaging in TEM
6. Contrast mechanisms of reflected electron imaging
7. Applications of UHV REM
8. Applications of non-UHV REM
Part III. Inelastic Scattering and Spectrometry of Reflected Electrons. 9. Phonon scattering in RHEED
10. Valence excitation in RHEED
11. Atomic inner-shell excitations in RHEED
12. Novel techniques associated with reflection electron imaging
Appendix A. Physical constants, electron wavelengths and wave numbers
Appendix B. Crystal inner potential and atomic scattering factor
Appendix C.1. Crystallographic structure systems
Appendix C.2. FORTRAN program for calculating crystallographic data
Appendix D. Electron diffraction patterns of several types of crystals structures
Appendix E. FORTRAN programs
Appendix F. Bibliography of REM, SREM and REELS
References.