Resonant X-Ray Scattering in Correlated Systems

Herausgegeben:Murakami, Youichi; Ishihara, Sumio

• Gebundenes Buch

Produktbeschreibung

The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.

Produktdetails

• Springer Tracts in Modern Physics 269
• Verlag: Springer / Springer Berlin Heidelberg / Springer, Berlin
• Artikelnr. des Verlages: 978-3-662-53225-6
• 1st ed. 2017
• Seitenzahl: 252
• Erscheinungstermin: 5. Januar 2017
• Englisch
• Abmessung: 241mm x 160mm x 20mm
• Gewicht: 506g
• ISBN-13: 9783662532256
• ISBN-10: 3662532255
• Artikelnr.: 45335139

Autorenporträt

Prof. Dr. Youichi Murakami is director of the Photon Factory at the Institute of Materials Structure Science at the High Energy Accelerator Research Organization (KEK) in Japan. Prof. Dr. Sumio Ishihara is head of the Theory of Condensed Matter Physics group in the Department of Physics at Tohoku University in Japan.

Inhaltsangabe

Resonant X-ray Scattering and Orbital Degree of Freedom in Correlated Electron Systems (S. Ishihara).- Resonant X-ray scattering in 3d electron systems (H. Nakao).- Observation of multipole orderings in f-electron systems by resonant x-ray diffraction (T. Matsumura).- Hard X-ray Resonant Scattering for Studying Magnetism (T. Arima).- Resonant soft x-ray scattering studies of transition-metal oxides (H. Wadati).- Resonant inelastic x-ray scattering in strongly correlated copper oxides (K. Ishii).