Response of some corn genotypes to late wilt disease - Abd El-Aziz, Mohamed
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Late wilt disease caused by Cephalosporium maydis is economically the most serious fungal disease of maize in Egypt. It causes a noticeable reduction in maize grain yield. In maize breeding programs, resistance to late wilt is considered the most effective method to control this disease. The possibilities of obtaining marked improvement in maize cultivars through using resistant inbred lines in hybrid combinations, has focused attention on this problem. This book will clarify the type of gene action, heritability and probable number of genes (or gene groups) controlling resistance to late wilt…mehr

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Produktbeschreibung
Late wilt disease caused by Cephalosporium maydis is economically the most serious fungal disease of maize in Egypt. It causes a noticeable reduction in maize grain yield. In maize breeding programs, resistance to late wilt is considered the most effective method to control this disease. The possibilities of obtaining marked improvement in maize cultivars through using resistant inbred lines in hybrid combinations, has focused attention on this problem. This book will clarify the type of gene action, heritability and probable number of genes (or gene groups) controlling resistance to late wilt disease in maize under natural and artificial infection conditions.
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Autorenporträt
He holds PhD. degree in plant breeding.He is a corn breeder in Field Crops Institute, Agriculture Research Center, Egypt.