Secondary Ion Mass Spectrometry SIMS II

Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27¿31, 1979
Herausgegeben von Benninghoven, A.; Evans, C. A.; Powell, R. A.; Shimizu, R.; Storms, H. A.

• Broschiertes Buch

Produktbeschreibung

This volume contains the proceedings of the Tenth International Converence on Secondary Ion Mass Spectrometry (SIMS X). It covers a diverse field of research ranging from environmental problems to depth profiling and semiconductors. In doing so, it provides an excellent overview of current research and technology by acknowledged experts in their specialised fields.

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Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.

Produktdetails

• Springer Series in Chemical Physics .9
• Verlag: Springer / Springer Berlin Heidelberg / Springer, Berlin
• Artikelnr. des Verlages: 978-3-642-61873-4
• Softcover reprint of the original 1st ed. 1979
• Seitenzahl: 320
• Erscheinungstermin: 13. Dezember 2011
• Englisch
• Abmessung: 229mm x 152mm x 18mm
• Gewicht: 465g
• ISBN-13: 9783642618734
• ISBN-10: 3642618731
• Artikelnr.: 36117329

Inhaltsangabe

I. Fundamentals Chairpersons: D.E. Harrison and C.A. Evans, Jr..- II. Quantitation Chairpersons: D.B. Wittry and P. Williams.- III. Semiconductors Chairpersons: C.W. Magee and W. Werner.- IV. Static SIMS Chairperson: A. Benninghoven.- V. Metallurgy Chairpersons: J.D. Brown and A.P. von Rosenstiel.- VI. Instrumentation Chairpersons: D.S. Simons and F.G. Rüdenauer.- VII. Geology Chairpersons: J. Okano and C. Meyer.- VIII. Panel Discussion Chairperson: I.L. Kofsky.- IX. Biology Chairpersons: M.S. Burns and G.H. Morrison.- X. Combined Techniques Chairpersons: C. Johnson and W.H. Christie.- XI. Postdeadline Papers.- Index of Authors.