Secondary Ion Mass Spectrometry SIMS II
Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27-31, 1979
Herausgegeben von Benninghoven, A.; Evans, C. A.; Powell, R. A.; Shimizu, R.; Storms, H. A.
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This volume contains the proceedings of the Tenth International Converence on Secondary Ion Mass Spectrometry (SIMS X). It covers a diverse field of research ranging from environmental problems to depth profiling and semiconductors. In doing so, it provides an excellent overview of current research and technology by acknowledged experts in their specialised fields.
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