Andere Kunden interessierten sich auch für
![Atom Probe Tomography]( "Atom Probe Tomography")
Atom Probe Tomography94,99 €![Mass Spectrometry of Priority Pollutants]( "Mass Spectrometry of Priority Pollutants")
Mass Spectrometry of Priority Pollutants39,99 €![Basic Gas Chromatography-Mass Spectrometry]( "Basic Gas Chromatography-Mass Spectrometry")
Basic Gas Chromatography-Mass Spectrometry40,99 €![Advanced Mass Spectrometry for Food Safety and Quality]( "Advanced Mass Spectrometry for Food Safety and Quality")
Advanced Mass Spectrometry for Food Safety and Quality136,99 €![Nanomaterials for Liquid Chromatography and Laser Desorption/Ionization Mass Spectrometry]( "Nanomaterials for Liquid Chromatography and Laser Desorption/Ionization Mass Spectrometry")
Nanomaterials for Liquid Chromatography and Laser Desorption/Ionization Mass Spectrometry74,99 €![Studying Cell Metabolism and Cell Interactions Using Microfluidic Devices Coupled with Mass Spectrometry]( "Studying Cell Metabolism and Cell Interactions Using Microfluidic Devices Coupled with Mass Spectrometry")
Studying Cell Metabolism and Cell Interactions Using Microfluidic Devices Coupled with Mass Spectrometry74,99 €![Applications of Time-of-Flight and Orbitrap Mass Spectrometry in Environmental, Food, Doping, and Forensic Analysis]( "Applications of Time-of-Flight and Orbitrap Mass Spectrometry in Environmental, Food, Doping, and Forensic Analysis")
Applications of Time-of-Flight and Orbitrap Mass Spectrometry in Environmental, Food, Doping, and Forensic Analysis149,99 €
Secondary ion mass spectrometry (SIMS) is a technique used in materials science and surface science to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions. These secondary ions are measured with a mass spectrometer to determine the elemental, isotopic, or molecular composition of the surface. SIMS is the most sensitive surface analysis technique, being able to detect elements present in the parts per billion range.