Selected Area Diffraction
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Selected area (electron) diffraction (abbreviated as SAD or SAED), is a crystallographic experimental technique that can be performed inside a transmission electron microscope (TEM). In a TEM, a thin crystalline specimen is subjected to a parallel beam of high-energy electrons. As TEM specimens are typically ~100 nm thick, and the electrons typically have an energy of 100-400 kiloelectron volts, the electrons pass through the sample easily. In this case, electrons are treated as wave-like, rather than particle-like (see wave-particle duality).

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Selected area (electron) diffraction (abbreviated as SAD or SAED), is a crystallographic experimental technique that can be performed inside a transmission electron microscope (TEM). In a TEM, a thin crystalline specimen is subjected to a parallel beam of high-energy electrons. As TEM specimens are typically ~100 nm thick, and the electrons typically have an energy of 100-400 kiloelectron volts, the electrons pass through the sample easily. In this case, electrons are treated as wave-like, rather than particle-like (see wave-particle duality).