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Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. _ Memory cell structures and fabrication technologies. _ Application-specific memories and architectures. _ Memory design, fault modeling and test algorithms, limitations, and trade-offs. _ Space environment, radiation hardening process and design techniques, and radiation testing. _ Memory stacks and multichip modules for gigabyte storage.

Produktbeschreibung
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
_ Memory cell structures and fabrication technologies.
_ Application-specific memories and architectures.
_ Memory design, fault modeling and test algorithms, limitations, and trade-offs.
_ Space environment, radiation hardening process and design techniques, and radiation testing.
_ Memory stacks and multichip modules for gigabyte storage.
Autorenporträt
ASHOK K. SHARMA is the author of Semiconductor Memories: Technology, Testing, and Reliability. He is currently working as a reliability engineering manager at NASA, Goddard Space Flight Center, Greenbelt, Maryland.