Zhenghao Gan, Waisum Wong, Juin Liou

Semiconductor Process Reliability in Practice

• Gebundenes Buch

Produktbeschreibung

Filled with practical examples, this is a comprehensive reference on process reliability for semiconductor process and design engineers.

Produktdetails

• Verlag: McGraw-Hill Education - Europe
• Seitenzahl: 624
• Erscheinungstermin: 16. November 2012
• Englisch
• Abmessung: 234mm x 158mm x 38mm
• Gewicht: 1050g
• ISBN-13: 9780071754279
• ISBN-10: 007175427X
• Artikelnr.: 33606357

Autorenporträt

Zhenghao Gan is a reliability technical manager at the Semiconductor Manufacturing International Corporation (SMIC), Shanghai, China. He has extensive technical and management experience in research and development of semiconductor reliability improvement, testing/characterization, problem solving, project management, modeling, and analysis. Waisum Wong, Ph.D., is in charge of process reliability at the Semiconductor Manufacturing International Corporation (SMIC), Shanghai, China. He has extensive experience in power device development and modeling. Juin J. Liou, Ph.D., is the Pegasus Distinguished Professor and UCF-Analog Devices Fellow in the Department of Electrical and Computer Engineering at the University of Central Florida. He has published eight books and has been awarded more than $9 million in research contracts and grants from federal agencies, state governments, and industry leaders.